Filter Results By:
Products
Applications
Manufacturers
X-ray Fluorescence
measure of irradated sample's fluorescence radiation revealing it's elemental composition.
See Also: XRF, X-ray Fluorescence Spectrometers
- Applied Rigaku Technologies, Inc
product
NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
-
product
X-ray Fluorescence Sulfur/Chlorine-in-oil Analyzer
MESA-7220V2
The MESA-7220V2 measures both sulfur and chlorine in petroleum based products using the Monochromatic Energy Dispersive X-ray Fluorescence (EDXRF) method. A monochromatic X-ray source is used in order to obtain an ultra-low noise background which affords the best detection limits for both sulfur and chlorine.The detector window size was increased to collect more fluorescent X-rays and thus achieve lower level ppm values. This provides excellent, repeatable performance at both low and high concentrations of both elements.By adjusting the angle of the graphite crystal, the excitation beam can be measured to excite sulfur in the sample, increasing sensitivity.
-
product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
-
product
Soil Analysis
We offer a full spectrum of analytical technologies, and sample clean up and moisture extraction reagents, designed to provide reliable, accurate, and precise results that make compliance easier and help you reduce regulatory risks. Organic Elemental Analysis, Trace Elemental Analysis, X-Ray Fluorescence (XRF) Spectrometry, Automated Discrete Photometry, Gas Chromatography Mass Spectrometry (GC-MS), Accelerated Solvent Extraction (ASE).
-
product
Coating thickness XRF Standards
We manufacture high accuracy reference standards capable of calibrating virtually any X-Ray Fluorescence (XRF) coating thickness and composition analysis system.
-
product
Continuous Particulate Monitor with X-ray Fluorescence
PX-375
There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
-
product
XRF Analyzers
Vanta iX
The Olympus Vanta™ iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line.
-
product
WDXRF Wafer Analyzer
2830 ZT
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
-
product
Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
-
product
XRF Analyzer
X-ray fluorescence (XRF) is a non-destructive analytical method used to determine elemental concentrations in various materials.
-
product
Sulphur Content Testers
X-ray fluorescence sulfur in oil analyzer, dark petroleum products sulphur content tester (tubular oven method)
-
product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
-
product
Spectrometers-XRF
For X-ray fluorescence spectrometers for elemental analysis or trace element analysis, SPECTRO is a world leader
-
product
Handheld XRF Analyzer
Genius-XRF
Zhengzhou Nanbei Instrument Equipment Co. Ltd
Based on the mature technology of desktop X-ray fluorescence analyzer and the latest technological development, and on the performance of the existing international commercial handheld X-ray fluorescence analyzer, adding new elements into it on the basis of the first, second, and third generation, Skyray Instrument has developed the intellectual portable fourth generational handheld analyzer-Genius XRF series, which can satisfy the market requirements and possess independent intellectual property rights.
-
product
Portable XRF Analyzer
X-5000
The Olympus X-5000™ is engineered to provide safe and superior in-the-field energy dispersive X-ray fluorescence (EDXRF) analysis. Functioning as a portable laboratory, this high-powered instrument is equipped with a secure closed-beam sample chamber and flexible analytical software that features a wide range of factory default and user-defined calibrations. The X-5000 offers the performance and safety of traditional benchtop EDXRF, merged with the cost-effective benefits and ruggedness of proven, portable XRF technology.
-
product
Tube-Above Wavelength Dispersive X-ray Fluorescence Spectrometer
ZSX Primus IV
As a tube-above sequential wavelength dispersive X-ray fluorescence spectrometer, the new Rigaku ZSX Primus IV delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards. ZSX Guidance supports you in all aspects of measurement and data analysis. Can accurate analysis only be performed by experts ? No — that is in the past. ZSX Guidance software, with the built-in XRF expertise and know-how of skilled experts, takes care of sophisticated settings. Operators simply input basic information about samples, analysis components and standard composition. Measured lines with the least overlap, optimum backgrounds and correction parameters (including line overlaps) are automatically set with aid of qualitative spectra.
-
product
Dispersive X-ray Fluorescence (EDXRF) Analyzers
Petro-Marine
The powerful Energy Dispersive X-ray Fluorescence (EDXRF) analyzers of Xenemetrix are capable of more sensitive and precise analysis than can be expected from a laboratory class analyzer.
-
product
Ambient Metal Analyzer
AMMS-100 XRF
The system integrates X-ray fluorescence for metal analysis up to 30 elements and a beta-ray attenuation model for particulate mass monitoring. But module will be using the same sample moving sequentially across the detector and would be significantly effective in industry emission tracing.
-
product
X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
-
product
EDXIR-Analysis Contaminant Finder/Material Inspector
EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
-
product
WDXRF Spectrometers
Zetium
X-ray fluorescence spectrometry (XRF) is capable of elemental analysis of a wide range of materials, including solids, liquids and loose powders. Designed to meet the most demanding process control and R&D applications, the Zetium XRF spectrometer leads the market in high-quality design and innovative features for sub-ppm to percentage analysis of Be to Am.
-
product
XRF Instruments
MasterXRF
Pratt & Whitney Measurement Systems, Inc.
The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal instrument for industrial process control, improving product quality, and saving money.
-
product
X-ray Fluorescence Measuring system
FISCHERSCOPE® X-RAY 4000 Series
Inline measuring with maximum endurance. Robust inline device for measuring on solid strips, punched grids with measuring structures from a few millimeters up to coated membranes or solid strips up to one meter wide.
-
product
X-ray Fluorescence Sulfur-in-Oil Analyzers
SLFA-2100/2800
The SLFA-2100/2800 are designed specifically to meet the recent demanding needs of measuring the new low sulfur fuels, diesel and RFG.Using the X-ray fluorescence technique, fast and accurate measurements can be carried out in compliance with the ASTM D4294 method, either in the lab or in the field.
-
product
X-ray Fluorescence Sulfur-in-Oil Analyzer
K581
Chongqing Kailian Yongrun Industrial Co.,Ltd.
It is designed to test mass(%) of total sulfur in crude petroleum, petroleum, heavy oil, diesel oil, gasoline and naphtha; to test total sulfur content in products of coal chemical industry, for instance primary benzene; to test total sulfur or sulfide in other liquids or solid power samples.Conforms to ASTM D4294, GB/T 17040 and GB/T 11140.
-
product
X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY 5000
Inline measuring with highest precision for thin films. Robust XRF instrument for measuring and analyzing thin films and layer systems in the running process with connection to the production control system.
-
product
Dispersive X-ray Fluorescence Spectrometer
SPECTRO MIDEX
SPECTRO Analytical Instruments GmbH
The SPECTRO MIDEX is known to be an all-round talent for the fast, non-destructive analysis of small spots and the rapid mapping of large surfaces (up 233x160 mm, 9.2x6.3’’) in research and development as well is in compliance screening applications as many elemental analysis tasks in industry, research and the sciences require a non-destructive measuring system that is extremely sensitive and offers a small measuring spot.
-
product
X-ray Fluorescence Spectrometer
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
-
product
Micro-XRF Spectrometers
Micro X-ray fluorescence spectrometry is the method of choice for the elemental analysis of non-homogeneous or irregularly shaped samples as well as small objects or even inclusions.
-
product
X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDAL®
Universal instrument for automated measuring of thin and very thin layers < 0.05 μm and for material analysis in the ppm range.
