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X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Analytical Services
Surface Analysis; X-Ray Photoelectron Spectroscopy (XPS, ESCA), Auger Electron Spectroscopy (AES), Time-of-Flight Secondary Ion Mass Spectrometry (Static) (TOF-SIMS), Dynamic Secondary Ion Mass Spectrometry (D-SIMS). Microscopy & Diffraction; Organic Material Analysis; Bulk Chemistry.
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X-ray Diffraction and Elemental Analysis
D8 ADVANCE
The intelligent beam path components of the D8 ADVANCE with DAVINCI design provide true plug'n play functionality requiring minimum or even no user intervention. Featuring automatic and tool-free switching of the diffraction geometry without the need for complex adjustments, the D8 ADVANCE with DAVINCI design broadens the analytical capabilities for a wide community of X-ray diffraction users.
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X-Ray Seamless Pixel Array Detector
XSPA-400 ER
In general, X-ray diffraction measurements using a Cu X-ray source are known to have difficulty detecting trace crystalline phases because of increased background when measuring samples containing transition metals. The high energy resolution of the XSPA-400 ER supresses the fluorescent X-rays originating from the sample, thereby reducing background, enabling highly sensitive measurements of samples containing transition metals, such as iron and steel compounds and battery materials.Therefore, it achieves higher sensitivity measurements than conventional detectors.
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In Situ Diagnostics
For researchers working on ultra thin films and novel interfaces, Neocera offers insitu, real-time process control and diagnostic tools such as high-pressure RHEED, Low Angle X-ray Spectroscopy (LAXS) and Ion Energy Spectroscopy (IES). RHEED provides exceptional growth control via RHEED intensity oscillations and the Structural data via diffraction. LAXS is a complimentary to RHEED and provides real-time Compositional information. IES provides energetics of the laser generated plasma plume which is directly responsible for obtaining high quality films and interfaces.
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Software
DIFFRAC.SUITE
DIFFRAC.SUITE represents a new software platform offering a wide range of software modules for easy X-ray powder diffraction data acquisition and evaluation. Based on Microsoft's .NET technology, DIFFRAC.SUITE offers all the advantages of most modern software technology for maximum ease of use and networking.
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X-ray Diffraction (XRD) Instruments
X-ray diffraction (XRD) is one of the most important non-destructive tools to analyze all kinds of matter—ranging from fluids, to powders and crystals. From research to production and engineering, XRD is an indispensable method for materials characterization and quality control. Rigaku has developed a range of diffractometers, in co-operation with academic and industrial users, which provide the most technically advanced, versatile and cost-effective diffraction solutions available today.
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Nuclear Magnetic Resonance Spectrometer
NMR
NMR is an abbreviation for Nuclear Magnetic Resonance. An NMR instrument allows the molecular structure of a material to be analyzed by observing and measuring the interaction of nuclear spins when placed in a powerful magnetic field.For the analysis of molecular structure at the atomic level, electron microscopes and X-ray diffraction instruments can also be used, but the advantages of NMR are that sample measurements are non-destructive and there is less sample preparation required.Fields of application include bio, foods, and chemistry, as well as new fields such as battery films and organic EL, which are improving and developing at remarkable speed. NMR has become an indispensable analysis tool in cutting-edge science and technology fields.
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Research XRD Diffractometers
X'Pert³
The successful X'Pert platform is continued by the Malvern Panalytical’s X'Pert³ range of X-ray diffraction systems. With new on-board control electronics, compliance with the latest and most stringent X-ray and motion safety norms, advances in eco-friendliness and reliability the X'Pert³ platform is ready for the future.
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X-Ray Diffraction
GNR Analytical Instruments Group
X-Ray Diffraction (XRD) is a non-destructive technique for the qualitative and quantitative analysis of the crystalline materials, in form of powder or solid.
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TEL-X-Ometer X-ray System
X-ray experiments can include radiography, x-ray fluorescence, and x-ray diffraction. All can be performed with the TEL-X-Ometer, a compact x-ray source designed for student use. Take a look at the TEL-X-Ometer and accessories today.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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Diffractometers & Scattering Systems
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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X-ray Diffraction and Elemental Analysis
D2 PHASER
The D2 PHASER is the most compact and fastest, all-in-one crystalline phase analysis tool available on the market. It is mobile and easy to install with only the need for standard electrical power. The D2 PHASER is therefore ideal for laboratory or on-location operation, in other words, it is a true Plug'n Analyze system.
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Benchtop X-ray diffraction (XRD) instrument
MiniFlex
New sixth generation MiniFlex X-ray diffractometer (XRD) is a multipurpose analytical instrument that can determine: phase identification and quantification, percent (%) crystallinity, crystallite size and strain, lattice parameter refinement, Rietveld refinement, and molecular structure. It is widely used in research, especially in material science and chemistry, as well as in industry for research and quality control. It is the newest addition to MiniFlex series of benchtop X-ray diffraction analyzers from Rigaku, which began with the introduction of the original MiniFlex system decades ago.
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X-ray Diffraction and Elemental Analysis
N8 HORIZON
The N8 HORIZON is a powerful tool for both high-end research and for multi-user facilities investigating a variety of nano-materials from solid bulks, to fibers, surfaces or biological samples.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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X-ray Optics
Do you want to shape your X-rays to a tiny point? Then our X-ray optics can help you. Benefit from 30 years of know-how in the development and manufacture of customized optical components for demanding applications. Our high-precision optics offer unsurpassed performance and enable the best results in a wide range of applications.
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X-ray Fluorescence
XRF analysis – one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed.
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X-ray Fluorescence
XRF is an elemental analysis technique with unique capabilities including (1) highly accurate determinations for major elements and (2) a broad elemental survey of the sample composition without standards. For example, XRF is used in analysis of rocks and metals with an accuracy of ~0.1% of the major elements.
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X-ray Microscopy
ZEISS Xradia Ultra
Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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X-Ray Components
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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X-ray sources / X-ray optics
X-ray sources are the heart of every X-ray analytical instrument. In combination with advanced X-ray optics, they generate the required X-ray radiation for structure analysis in various fields of material and life sciences. X-ray sources must offer perfect thermal constancy for excellent position stability of the X-ray beam as well as high intensity, even at low power levels. The design has to guarantee easy integration into advanced X-ray equipment paired with straightforward operation to keep uptimes high and to guarantee maximum radiation safety for operators and equipment.
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Medical And Dental X-Ray
Teledyne DALSA offers powerful, innovative CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for applications such as orthopedic and surgical radiology, mammography, intra- and extra-oral dental radiology, CT, and bone densitometry
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X-Ray
VJ Electronix offers manual and fully automated inspection systems for applications such as PCB assembly, semiconductor packages, electromechanical assemblies, biomedical/pharmaceuticals, batteries, and more. Our systems offer a range of imaging options and simple manual or programmable operation. In addition, custom inspection systems are available tailored specifically for your production requirements. All of our products are easily integrated into the manufacturing process for fast start-up and 24/7 operation. Their versatility and ease-of-use deliver repeatable results with all levels of production staff.
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X-ray Inspection System
TruView™ Simplex
We created the SimpleX because sometimes all we need is a simple and easy to use X-ray machine to take X-ray images. TruView™ SimpleX: as simple as it gets.
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X-ray Microscopy
Xradia Family
✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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X-Ray Inspection
MXI Jade Plus
Restrictions in manufacturing materials and ever increasing expectations for reliability mean ensuring quality product manufacture is more important than ever. Jade Plus enables you to Prove Your Quality and reduce product returns from the field, and the associated cost and damage to reputation.
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
