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Test Heads
1) interchangeable assembly connecting test signals between DUT and ATE. 2) representation of a human head. 3) provide network test access.
See Also: Heads, Test Probes
- InterWorking Labs, Inc.
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UDP Test Suite
The UDP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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HD Tester with VGA, Audio, Video, HD-TVI
M-HD-360A
Fuzhou Metricu Technology Co Ltd
Analog camera testHD-TVI camera test, HD-CVI camera test, AHD camera testDC12V 1A power outputVGA input, support 1920 x 1200P 60FPSAuto HD, auto recognize HD coax camera type and resolutionUTP cable test, detect the near-end, mid-end and far-end fault point of the network cable crystal head
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Van der Hoofden Test Head
The "Van der Hoofden“ test head allows to determine the exposure of humans to radiation caused byluminaries.
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Signal Integrity Test Products
RoBAT RCI
*TDR & TDT, Measurement Capabilities*Impedance, Skew, Backdrill measurements*Automated Optical Inspection*DC Electrical Test*Now available with 4 heads*24 port (1 port per channel) TDR/TDT unit*Future capabilities – Fully automated VNA test (4 port S-Parameter Measurement)
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Spring Loaded Contacts
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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RF/Wireless Test Fixtures
Test‐Head Engineering develops and manufactures RF Test Fixtures which allow the testing of RF and Wireless modules and components.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Pod/Nest Fixtures
Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing. Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.
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Wafer Probe Loadboards/PIB
DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. DTS wafer test loadboards are compatible with a variety of pogo pin interface towers. All PIBs are constructed with impedance control, precision matched line lengths, full power and ground planes and both analog and digital resources to provide high quality signal integrity directly to the device.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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AMIDA 3KS Tester
The AMIDA-3KS test system provides a lower cost, cost-optimized test solution for all consumer power management ICs and portable product components. The AMIDA-3KS tester provides 6 board slots in the test head for the required number of analog board channels, thus reducing the overall system procurement cost, making the cost-effectiveness of each board channel 2 times higher and more flexible. The customer's product testing time is greatly shortened.
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WLCSP Probe Heads
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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HEAD acoustics Radio Analyzer Tool
TUNE
The HEAD acoustics Radio Analyzer Tool TUNE allows a reproducible analytical evaluation of the impact of analog radio broadcast disturbances on perceived audio quality based on auditory test results.
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Whole Body EM Phantoms
EM - PHANTOM
Schmid & Partner Engineering AG
The POsable Phantom for Electromagnetic sYstems Evaluations (POPEYE) is an anatomically correct human phantom based on a torso shell w/ head with posable arms, hands and legs. This radio frequency (RF) human has been designed to meet the requirements for test configurations for which the effects of the body on the EM performance cannot be neglected, such as operating tablet and laptop computers and other body-mounted transmitters. With a simple adjustment (one tightening screw), the arms, hands and legs can be positioned accordingly for conducting simulations of any usage or operation (standing, sitting, arms raised, talking position, etc...).
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Flying Prober Test System
QTOUCH1404C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built high resolution Vision Camera for easy monitoring of probe needle contact. The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision.
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Scanner Probe
RFS set
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
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Scanning Head For Energy Meter Test
PACB108
PACB08 is the accessory device to perform the energy meter test, which can work together with PONOVO’s relay test sets to test energy meter by using Energy Meter Module in Powertest software.
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Becker Transponder Test Fixture
TA-3400
This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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Bench Type Panel Meter
ED-205
Standard Electric Works Co., Ltd
● Dimension：91(L) × 103(W) × 100(D)mm● Deflection Angle : 90°● Scale Length：Approx. 65mm ● Terminal： 4mm socket captive head, suitable for wire or pin-type test lead.● Material And Color： Acrylic resin meter cover, white scale plate, plastic stand in black.● Safety Standard： IEC/EN 61010-1 CAT Ⅱ 300V EN 61326-1 EN 61000-4-2 EN 61000-4-3
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Rockwell Hardness Tester
Versitron® Series
Newage Testing Instruments, Inc.
The Versitron Rockwell hardness testing system is the industry workhorse of hardness testing - designed to meet the toughest challenges: clamp large parts, operate in poor environments, and test high volumes - all with less service problems and less operator skill requirements. Available with 2 different test stands types (in a range of sizes) and 2 test heads and also a wide range of other options.
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Hydrostatic Head Tester
TF163
TESTEX Testing Equipment Systems Ltd.
Hydrostatic Head Tester, used for determining the resistance of fabrics (canvas, coated fabrics, cover cloth, rainproof clothing fabrics, and geotextile materials) and films to water penetration under pressure while firmly clamped in the test rig of standard area.
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MEMS-Scanner Evaluation-Kit
The "QSDrive Scan Kit" evaluation kit enables small and medium-sized companies in particular to operate ResoLin components from the Fraunhofer IPMS in accordance with the specifications without the time-consuming in-house development of control electronics. The evaluation kit consists of a ResoLin component – a cardanic MEMS scanner with a linear axis and an optional, orthogonally oriented resonant axis – and control electronics that enable the components to be operated with an optimized trajectory supplied. The component is held by a scan head, which is also included in the scope of delivery and which, thanks to its special construction, can easily be integrated into common optical test setups. Depending on the design of the MEMS component, controlled operation of the component and synchronized operation of the resonant axis are also possible. The function is controlled by software that communicates with the electronics via USB.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Manual Test Adapter
linear pin compressionhinged carrier for probe cardfacilitated probe tower positioningmounted onto test head stiffener
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Optical Power and Wavelength Meter
OMM-6810B
The OMM-6810B is a power and wavelength meter capable of simultaneously measuring the optical power and wavelength of a laser source. A wide variety of measurement heads cover wavelength ranges from 350 to 1650 nm for power ranges of up to +40dBm or 10W.This meter has standard features such as logarithmic or linear display modes, auto ranging, user calibratable offset, reference measurement capability, analog output and IEEE-standard GPIB interface to make this instrument a cost effective laser diode development or production test tool.
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Test Head Manipulators
Cobal 250
The Cobal 250 offers the best-in-class range of motion for universal manipulators with seven degrees of motion. Separate linear movements make it easier for the operator to dock, undock, and redock the test head in seconds. In combination with inTEST EMS docking, the Cobal 250 is compatible with testers for both Wafer Sort and Final Test, minimizing the time and cost when moving a tester between Sort and Final Test.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Portable Hardness Tester
Magnetic Type QualiMag Series
The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell test head fixes to the surface of iron and steel parts to test the hardness by applying magnetic force. Meant to replace Leeb hardness testers which are not as accurate nor reliable. Use the Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester on steel parts, steel plates, steel pipes, forgings, large to medium sized heat treated parts(if surface available), welding joints, pressure vessels, etc. The Portable Hardness Tester - Magnetic Type QualiMag-R - Magnetic Rockwell Hardness Tester Rockwell complies with Standards ISO 6508 and ASTM E18.
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Final Test Manipulators
for test heads up to 250 kg / 550 lbsfinal test dedicatedhandler docking prolowest possible floor loadeasy motion in z-direction to facilitate docking processforce feedback control feature ensuring operator safety and protecting equipment during set-upactive cable managementdurable and robust designoptimized footprint for various test heads580 mm linear in/out motion for handler service access160 mm linear side-to-side feature270 column pivoting featurenumerous additional, unique features for individual set-up requirements
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Welding Resistance Tester
WRT
The Welding Resistance Tester is used in battery assembly lines to detect defective intercell connections. It is equipped with a 5-channel test head for car and truck batteries. It features 1-20 O DC resistance ranges and a multi-line LC display for OCV, CCV, and DCR measurements for 5 intercell connections.
