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Silicon
atomic number 14 tetravalent metalloid chemical element.
- Applied Rigaku Technologies, Inc
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Software
Active Silicon computer vision products are supported by a variety of software tools. We provide powerful user software and SDKs for CoaXPress and Camera Link frame grabbers with support across several operating systems. Additionally, a wide range of drivers for third-party machine vision and scientific imaging packages is available.
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Photo Detector Laser Power Meters
11PD100-Si
Silicon detectors provide a generous aperture for laser beams up to 10 mm in diameter. The threaded aperture allows you to install filters, attenuators, fiber optic adapters or other optics that suit your specific needs.
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Citadel CTD-ES
Teledyne Marine RD Instruments
The CITADEL CTD-ES incorporates proven inductively coupled conductivity sensor technology with a platinum resistance thermometer and micromachined silicon pressure sensor to provide highly accurate and stable readings.
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ATE Test & Engineering Services
We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Microwave Cables
Silicon Dioxide cable is a high stability cable at high temperatures and high frequencies. Because of thishigh stability silicon dioxide cables are currently used in nuclear reactors, decoy boxes, radars, satellites,aircraft and sophisticated missile applications. Measure Tech's Silicon Dioxide cable assemblies are excellentfor operation in extreme environment conditions where stability is crucial. Measure Tech's Silicon Dioxidecable is currently used by Lockheed Martin in their JASSM missiles. Measure Tech currently has 100% on timecdelivery for the Silicon Dioxide Cables delivered to Lockheed Martin.
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Infrared Gas Detector
GD10 Series
Teledyne Gas & Flame Detection
The GD10 Series has been designed with features that provide an effective response to the detection of gas hazards in a wide range of industrial environments from boiler plant rooms to offshore petrochemical installations.These infrared gas detectors differ from all other models, because they utilize silicon based solid-state infrared sources. The complete optomechanical design and construction is so stable that an ultra fast speed of response can be achieved while providing unparalleled service life and detector stability, thus saving on maintenance and service costs.We offer the longest combined detector and IR source warranty on the market.
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Optical Power Monitor Instruments
MPA-100
MPA-100 is a highly integrated rack mountable model of pigtailed photo-detectors. Multi-channel optical power from MPO or MTP connectors are measured. Photo-detectors of Silicon type for 850 nm range and InGaAs type for 1260 - 1610 nm are available. The detected photo-current is converted into a voltage output using a 16-bit multi-channel DAQ interface. The dimensions are (W) 482.6 x (D) 430 x (H) 44 mm. The highly integrated MPA-100 is available up to 80 channels with an excellent cost performance and small footprint. The MPA-100 is useful for many 40 GbE / 100 GbE applications, such as testing and monitoring of transceivers (SR4, SR10, LR4, and ER4) for data communications, broadband / CATV, and telecommunications. Tap-PD model (Eg. a partial 5 % tapped power detection) is also available with customization.
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BSDL File Validation
Corelis offers services to validate the accuracy of Boundary-Scan Description Language (BSDL) files that characterize the boundary-scan functionality of semiconductor devices. These services include validation of a device's BSDL file while the chip is still in development and BSDL file accuracy verification against actual silicon.
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Embedded PCs
Powered by NXP, Nividia, Rockchip, and TI silicons, Advantech Arm-based Edge AI Boxes and IoT gateways are designed for the AIoT applications.
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Precision Integrated Analog Front End, Controller, & PWM for Battery Test & Formation Systems
The AD8452 combines a precision analog front-end controller and switch mode power supply (SMPS), pulse-width modulator (PWM) driver into a single silicon platform for high volume battery testing and formation manufacturing. A precision instrumentation amplifier (in-amp) measures the battery charge/discharge current to better than ±0.1% accuracy, while an equally accurate difference amplifier measures the battery voltage. Internal laser trimmed resistor networks establish the in-amp and difference amplifier gains (66 V/V and 0.4 V/V, respectively), and stabilize the AD8452 performance across the rated operating temperature range.
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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400/5A CHEAP SPLIT CORE CAST RESIN CURRENT TRANSFORMER
LZCK310-10
Beijing GFUVE Electronics Co.,Ltd.
LZCK series outdoor waterproof current transformers are applicable for AC power system 35kV and measurement of current of power supply equipment below 10KV also can be used for microcomputer protection. This type of current transformer employs imported silicon steel which with high permeability as magnetic material, has the characteristics of Small magnetic circuit loss and can be split, its semicircular core and secondary windings employ high quality epoxy resin vacuum, casting in plastic-case(ABS or PC) which is flame retardance anti-moisture, stable performance, no maintenance.
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Measurement System
BLS-I/BCT-400
The BLS-I/BCT-400 measurement systems perform lifetime measurement on monocrystalline or multicrystalline silicon (ingots or bricks) without requiring surface passivation.
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PSE Conformance Test Suites
2-Pair 802.3bt / 802.3at PSE's
*Robust 2-Pair 802.3at (Type-1, 2) / 802.3bt (Type-3) PSE Conformance Testing*Fully Automated Port Sequencing and Statistics*Greater than 95% 802.3at PICS Coverage from 23 Fully Automated Tests*Pop-Up Excel Reports Covering 1 to 24 Ports*Widely Used by PSE System and Silicon Manufacturers World Wide
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AC Hysteresis Graph Test System
DX-2012SA
Under continuous frequency of 1 kHz to 500 kHz, automatic measurement of magnetic hysteresis loop of the soft magnetic materials such as silicon steel, precision alloy, non-crystal and ferrite, accurate measurement on the dynamic magnetic characteristic parameters such as amplitude permeability µa, loss angle d, loss iron Pc, remanence Br and coercivity Hc.
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Photodiodes
Opto Diode manufactures high quality standard and custom photodiodes. Our wide range of standard device feature low dark current and low capacitance. The silicon detectors are ideal for general purpose applications, laser monitoring, position sensing, measuring photons, electrons, or X-rays, or for detecting sun and rain applications. The devices operate from the deep UV to the near-infrared wavelengths.
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Thermal Neutron Detector
TN15
The TN15 high sensitivity thermal neutron detector utilizes a state-of-the-art silicon photomultiplier (SiPM) and offers world-leading specification in a compact form. The TN15 surpasses the performance of a 100mm long 13mm3 He tube at 4 atmospheres and does not need cooling but operates at room temperature.
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XMC Display Control Card
XM26001
LinkedHope Intelligent Technologies Co.,Ltd.
XM26001 is a graphics, image processing and computing single-board computer independently developed by Linghao Intelligent®. It uses the AMD G series APU GX-210HA by default, integrating the CPU, GPU, south bridge and north bridge on one silicon chip.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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4-Probe Resistivity and Resistance Tester
HS-MPRT-5
t used for measuring resistivity of silicon rods and wafers, and sheet resistance of diffused layers, epitaxial layers, LTO conductive films and conductive rubbers, etc.
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Pressure Sensor
Through state-of-the-art silicon MEMS(Micro Electronics Mechanical System) process and assembly technology, Fujikura produces various types of piezo-resistive pressure sensor such as sensing elements, integrated sensors and modules. The products feature high-accuracy, high-reliability and cost-effectiveness.
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MICROWAVE VARIABLE-CAPACITANCE DIODES FROM 1 to 40 GHz
Insight Product Company offers Microwave Variable-Capacitance Diodes with capacity coverage ratio over 10 times and operating in frequency range from 1 to 40 GHz. The p+ -n1 - n2 -n+ silicon variable-capacitance diodes are designed to electrically tune frequences and phases of microwave oscillators - parts of hybrid microcircuits that provide capsulation and protection against ambient action.
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Radiation Microdosimeters
Teledyne e2v HiRel Microdosimeter is a compact hybrid microcircuit which directly measures total ionizing dose (TID) absorbed by an internal silicon test mass. The test mass simulates silicon die of integrated circuits on-board a host spacecraft in critical mission payloads and subsystems. By accurately measuring the energy absorbed from electrons, protons, and gamma rays, an estimate of the dose absorbed by other electronic devices on the same vehicle can be made. The Microdosimeter can operate from a wide range of input voltages. The accumulated dose is presented to three dc linear outputs and one pseudo-logarithmic output giving a dose resolution of 14 µrads and a measurement range up to 40 krads. These outputs are intended to be directly connected to most analog-to-digital converters (ADCs) or spacecraft housekeeping analog inputs (0-5 V range), which makes minimal demands on the host vehicle. The Microdosimeter incorporates a test function to allow electrical testing of the hybrid without the need for a radiation source.
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Silicon O/C Content Tester
OCT-2000
Manual, non-contact measurement of wafer thickness, TTV and bow. Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.
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Advanced Node Solution
A major new challenge at 20nm/14nm is the requirement for extra masks (double patterning technology, or DPT) to make existing lithography work at this advanced node. Read 20 questions on 20nm - a Q&A document. Escalating data volume and denser, more complex chips are testing the limits of traditional routing architectures. Even the slightest perturbations in the design flow can cause dramatic swings in design integrity. Engineers face a predictability crisis riddled with silicon failures, performance degradation, and prolonged design schedules. And new process and design innovationshigh-k metal gate, SOI, 3D-IC packagingare intensifying the pressures of adoption and rapid deployment.
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Semi-Automatic Contactless Wafer Detector
NCS-200SA
Semi-Automatically, non-contact measurement of wafer thickness, TTV ,bow,Point and flatness.Portable and easy to set-up, the Proforma 300/G measures all wafer materials including Silicon, Gallium-Arsenide, Indium-Phosphide and wafers mounted to sapphire or tape.the powerful software can test all the data above within several seconds,all the design according to SEMI standard and the ASTM,make sure the data can be easily unify. the system can used for several sample size,like 75 mm, 100 mm, 125 mm, 150 mm, 200 mm
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Temperature Measurement IR Sensors & Detectors
ST60 High Temperature
A single-channel silicon-based thermopile that will withstand operating temperatures of 225C, with a small active area of 0.61mm x 0.61mm in a TO-5 package. The reduced height package functions as an internal aperture. Two thermistor options provide ambient package temperature measurement. Currently only available with 8-14um silicon window. Time constant of 18ms with Nitrogen encapsulation gas delivers a very low Temperature Coefficient of Responsivity of -0.4%C. This detector has a very short thermal shock response to ambient temperature change.
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Split Core Current Transformers
LZCK-55
Beijing GFUVE Electronics Co.,Ltd.
Outdoor waterproof current transformers are applicable for AC power system 35kV and measurement of current of power supply equipment below 10KV also can be used for microcomputer protection. This type of current transformer employs imported silicon steel which with high permeability as magnetic material, has the characteristics of Small magnetic circuit loss and can be split, its semicircular core and secondary windings employ high quality epoxy resin vacuum, casting in plastic-case(ABS or PC) which is flame retardance anti-moisture, stable performance, no maintenance.
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Silicon Nails Feature Development And Runtime, GTE 10.00p
K8228A
The Silicon Nails test development tool also allows users to define the vectors that they would like to execute on the non-compliant boundary scan device. The test development tool will generate the boundary scan test to output or input at the relevant interconnecting pin, thus generating the test consistently.
