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- Virginia Panel Corporation
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ITA, I2 Micro ICon, 168 Position, With Oversized Backshell
410130106
The i2 Micro iCon ITA with oversized cable clamp is capable of holding up to 168 QuadraPaddle contacts. With a wider 1.97” footprint, it is ideal for applications requiring shielded twisted pair wiring or other wire types with oversized jackets. The 30-degree u-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.80". The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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CMM Contact Measurement (Probing)
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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DDR3 MSO Probes
The DDR3 DIMM and SO-DIMM Mixed Signal Interposers connect Address, Command and Control signals of a DDR3 bus to the Keysight V-Series Oscilloscopes with the MSO option. These interposers also provide accessibility to DDR3signals for convenient analog probing.
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Solid Tungsten Probe Tips
ST Series
The ST SERIESof probe tips, available from GGB Industries, Inc., are precision crafted from a 0.020 inch (0.51mm) diameter solid tungsten shaft that is electrochemically sharpened to a specified point. These durable, 1.5 inch long solid tungsten shaft probe tips are for use in most standard micropositioners when probing an integrated circuit, pad, or line. A variety of radius point sizes from 0.5 microns to 10 microns are available to accommodate any probing need.
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Surface Mount Package Emulation
SMT Adapters
Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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Sampling Scope Adapter
N5477A
The N5477A sampling scope adapter makes the InfiniiMax III probing system fully compatible with the Infiniium 86100 DCA sampling scope family. With the N5477A, the DCA modules have 30 GHz of probing, increasing their performance and flexibility.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Inline Micropositioner
SP-150
Signatone's most stable and precise micropositioner for sub-micron probing.
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Auxiliary Equipment For Probing Machines
We have a lineup of products that support the probing process.
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High Voltage Passive Probes
The PPE6KV-A and HVP120 can handle up to 6000 Vpeak transient overvoltages and are designed for probing up to 2000 Vrms and 1000 Vrms respectively. Fast rise times, excellent frequency response, and a variety of standard accessories make these probes safe and ideal for high voltage measurement applications
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Wide Band Gap Production System
Reedholm has configured an integrated system, not just a set of boxes, for testing high power devices at the wafer level. Sophisticated testing, prober control, and database management do not carry a programming burden. As a result, fast, automated wafer testing is done in an inexpensive, compact probing platform.
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BGA Interposer, LPDDR4 200-ball, 2-wing For Logic Analyzer, Connects To 61-pin ZIF
W6601A
The W6601A LPDDR4 2-wing BGA interposer for LPDDR4 200-ball BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A logic analyzer module it is compatible with. The W6601A is the smallest BGA interposer for LPDDR4 200-ball DRAM capable of capturing simultaneous read and write traffic at data rates in excess of 3.2 Gb/s. U4208A and U4209A probe/cables connect W6601A LPDDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W6601A BGA interposer wings. Refer to the W6601A data sheet for complete list of LPDDR4 signals probed with the W6601A.
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SHG Spectrometer
Second harmonic generation (SHG) is an effective technique for surface probing. By SHG, monolayer adsorbtion can be detected. With different input/output beam polarizations SHG can yield information on the average orientation of molecular adsorbates.
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Positional Current Probe, PCB Track Touch And Measure
I-prober 520
Current measurement from insulated probing of conductorSuitable for observation and measurement of current in PCB tracks, component leads and ground planesWide dynamic range of 10mA to 20A peak to peakWide bandwidth of DC to 5MHzLow noise figure equivalent to <6mA rms at full B/WSafety rated to 300V Cat II (600V Cat 1)Suitable for connection to any oscilloscopeHigh accuracy general purpose H-field probeConverts to 'closed magnetic circuit' current probe
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PCB Test Fixture Kits And Customized Fixtures
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Probe System
Acculogic FLS 980 Dxi
Flying Probe systems do not require test fixtures, have few restrictions on board access and can test boards with a virtually unlimited number of networks. They also allow developers to complete test programs in a short time.The FLS980 Dxi guarantees superior probing precision and repeatability, even as component sizes and denser packaging technologies pose challenges to other test engineers.
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Digital Display Auto Circuit Tester
1676
Peaceful Thriving Enterprise Co Ltd
This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.
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Manual Probearm for HBM and Flex-Pitch Applications
TPA-GFM
High Power Pulse Instruments GmbH
*Electrically isolated probearm for GND needle contact or general purpose DC, twin-wire HBM or flexible pitch VF-TLP/TLP/HMM/HBM force/sense probing based on the HPPI GF-A flexible pitch setup.*Suitable to mount the GF-A ground fixture needle for flexible pitch measurements. In addition a cable (e.g. for HBM) can be directly connected to the contact pin.*High stability
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WaveMaster Oscilloscope, 4 GHz Bandwidth, 4 Input Channels, 40 GS/s Max Sample Rate
WaveMaster 804Zi-B
Up to 20 GHz bandwidth and 80 GS/s sample rate.The most advanced oscilloscope user interface.The industry’s only true hardware 14.1 Gb/s serial trigger.Low Jitter Measurement Floor and exceptional timebase stability.Comprehensive set of serial data analysis, debug, validation and compliance tools.Integrated 50 Ω and 1 MΩ inputs for true connection and probing flexibility.Integrated standard and custom measurements and math functions for unrivaled analysis capability.Multi-lane serial data eye, jitter and crosstalk analysis.Real-time de-embedding, emulation, and equalization.
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Vacuum Probing Systems
Built using our PS4L patented technology, SemiProbe manufactures a family of Vacuum Probing Systems, which test wafers or substrates in a vacuum environment. Additionally, individual die and broken/partial wafers can be tested with the Vacuum Probing System. All key modules are interchangeable and upgradeable.
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DDR4 X16 2-wing BGA Interposer For Logic Analyzers, Connects To 61-pin ZIF
W4641A
The W4641A DDR4 2-wing BGA interposer for DDR4 x16 BGA DRAM probing takes full advantage of the quad sample state mode on the U4164A the W4641A is the smallest BGA interposers for DDR4 x16 DRAM capable of capturing simultaneous read and write traffic at data rates exceeding 3.2 Gb/s. U4208A and U4209A probe/cables connect any W4640A Series DDR4 BGA interposer directly into the U4164A logic analyzer module from 61-pin high density zero insertion force (ZIF) connectors that attach to the W4640A Series BGA interposer wings.
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LPDDR5 Protocol Debug And Analysis Solution
U4971A
The LPDDR5 Solution Bundle provides a systemized hardware, probing, and software solution for LPDDR / 2 / 3 / 4 / 5 protocol debug, compliance validation, and analysis.
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Probing, Monitoring & Setting
Marposs offers solutions and equipment that make your machine tool an instrument of unprecedented precision, productivity and reliability. Touch probes and laser-based tool setters hold the cutting process accuracy in check. Our balancing actuators and many dedicated sensors guarantee that your machine tool's functional processes never deviate from their specified set points.
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Infiniium UXR-Series Oscilloscope: 10 GHz, 4 Channels, 3.5 Mm
UXR0104A
The UXR0104AA is the 10 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope with the most comprehensive set of probing, analysis applications, and measurements for advanced technologies. EVM performance for wideband mmWave measurements that rivals even the best signal analyzers. UXR-Series scopes have flexible upgrades: Bandwidth up to 110GHz, Memory up to 2Gpts, DDC up to 2.16GHz, and configurable frequency extensions up to 10GHz.
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Inspection And Measuring Microscope
McBain ZIII Micro Inspection System
The McBain ZIII Micro Inspection System is the industry standard for CD measurements and inspection, pre/post dicing inspection, pre/post probing inspection, mask inspection, image stitching and critical particle counting.
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i1 XL (High Power)
Ideal for high amperage applications. Single module offers 4 high power contacts in one connector. Removable backshell allows easy access to wiring for maintenance and probing.
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Portable Wafer Probe Station
PS-5026B
High Power Pulse Instruments GmbH
The PS-5026B is a rugged portable wafer probing solution which has been designed for high reliability, compact size and minimum cost.
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TTL/I2C/SPI Expansion Kit
OP-SB85L
OP-SB85L is the interface expansion kit that has a port to measure TTL / CMOS signal level communications, and the one to measure the voltage of high-speed analog input. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communication between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI on monitoring and simulating.
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
CAMI Research Inc. (CableEye®)
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large library to match your connector. Then touch the tester probe to the connector pins one-by-one to automatically detect and assign a test point to each pin. A synthetic voice reads probed pins as you touch them so you don’t need to take your eyes off the connector you’re probing. Finally, enter pin labels of your choice if you wish to override the standard designations.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
