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Surface Analysis and Materials Characterization Services
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Single Frequency Lasers: 355 nm – 1064 nm up to 3 W
Cobolt 05-01 Series
High power, single frequency CW diode pumped lasers: 355 nm – 1064 nm up to 3 W. Perfect for holography, interferometry, Raman, optical tweezers, super resolution microscopy, laser doppler velocimetry
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785165-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Modular Raman Spectrometers
Multifunction confocal Raman microscopy system, based on new designed confocal microscopy techniques, with the ultra-low noise CCD camera latest advanced for Raman detection, highresolution spectrometer, attaining superior user friendliness and sensitivity.
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Analytical Techniques
Anderson Materials Evaluation, Inc.
Our numerous analytical techniques, we tackle a wide range of materials challenges and commonly combines several analytical techniques to fully address complex and multi-dimensional materials issues. Our materials analysis laboratory provides XPS surface analysis, thermal analysis (TGA, DSC, TMA), FTIR infrared spectroscopy, UV-Vis spectrophotometry and reflectivity measurements, gas chromatography – mass spectroscopy (GC-MS), SEM/EDX, optical microscopy, mechanical testing, electrochemistry and corrosion analyses, residual gas mass spectroscopy, contact angle measurements, surface contamination measurements, adhesive bonding failure analysis, facility testing for silicone contamination, mechanical testing, metallography and fractography, density and porosity measurements, volatile organic component testing, friction, and other analytical capabilities. We continue to upgrade and expand our arsenal of analytical techniques and custom analytical methods to support our customers’ needs.
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Fluorescence Microscopes
PicoQuant offers different solutions for time-resolved confocal microscopy. The available systems include single molecule sensitive microscopes with picosecond temporal resolution and super-resolution imaging capabilities as well as upgrade kits for laser scanning microscopes of all major manufacturers that enable time-resolved applications.
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Industrial Microscope Systems
Below you can see two industrial microscope systems which can be created using our components. Many other automated microscopy systems are possible using our components.
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X-ray Microscopy
ZEISS Xradia Versa
Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.
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*Laser Spectroscopy
*Sum Frequency Generation (SFG) vibrational spectroscopy and microscopy*Investigation of surfaces and interfaces of solids, liquids, polymers, biological membranes and other systems
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Universal Illumination System
NEW pE-4000
NEW GENERATION LEDs The pE-4000 sets the standard as the universal illumination system for fluorescence microscopy. The system has 16 selectable LED wavelengths across 4 channels that can be matched to the filters and fluorophores of almost any microscope, making it the broadest spectrum of illumination available. The CoolLED pE-4000 now benefits from our award winning sustainable Green technologyand delivers enhanced intensity at your microscope sample plane with a significant reduction in energy consumption, and is supplied with a 3 year warranty after registration.
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Desktop Fluorescence Microscope
Nanoimager
The complete package for super-resolution microscopy
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Microscropy Cameras
Whether you are shopping for the best price-to-performance microscopy camera to include with your new microscope setup, or you are looking to retrofit and older microscope to make it useful again, there is just the right INFINITY microscopy camera to meet your needs.Using the latest in advanced sensor technology, INFINITY microscopy cameras address the needs of fluorescence imaging, as well as produce vivid color images for use in education and lab settings. The INFINITY microscope camera body provides a heat-dissipating design that reduces noise without the need for costly fans or cooling systems, and INFINITY microscope cameras are compatible with most c-mount microscopes.
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Chromaline Camera
MC2
Sciences et Techniques Industrielles de la Lumière
Because of this limitation, expensive and complicated Z-scanning systems and/or auto-focusing mechanisms are required to view samples with larger Z-extension and moving samples.Chromaline camera incorporating chromatic confocal microscopy technology is a technology that enables the design of optical systems with a very large depth of field (up to several mm).With Chromaline camera, frequency acquisition is available up to 199,500 lines/second.
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Compound Microscope
EXC-400 Microscope Series
400 Series is designed for a broad range of microscopy applications in clinical, academic and research environments. While ideal for routine observations, the EXC-400 can be configured for several contrast methods including brightfield, phase contrast, polarized light, Gout analysis, and fluorescence featuring integrated LED illumination and Chroma® filter sets.
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PXIe-5763, 16-Bit, 500 MS/s, 4-Channel PXI FlexRIO Digitizer
785161-01
The PXIe-5763 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PXIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Illuminators
FRAEN®
Our newest line of FRAEN® illuminators for 1, 2 and 3 color reflected light fluorescence can transform a standard brightfield microscope into a unit capable of fluorescence! FRAEN’s FLUOLED® 1CFW and 3CFW represent a fast, cost-effective and reliable solution for fluorescence microscopy using LEDs as a source for excitation.
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Laboratory Instrumentation
Haydon Kerk Pittman has developed motion control systems used in: multi-axis sample management systems requiring high performance and reliability to meet high duty cycle requirements; microscopy stages demanding high precision positioning in multiple axis simultaneously; motion systems for automatic pipetting which requires very accurate motion for aspiration and dispense modes helping to eliminate manual pipetting errors.
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Scientific CCD Image Sensors
Our front and backside illuminated (BSI) and backthinned Charge Coupled Devices (CCDs) are seen as the gold standard for scientific and quantum imaging in applications in spectroscopy, microscopy, In vivo, x-ray and astronomy. We understand that every imaging application is unique and requires our engineers and scientists to work closely with our customers providing highly tailored imaging solutions.
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Light Source
pE-300ultra
CoolLED's pE-300ultrais a fluorescence microscopy light source which offers intense, broad-spectrum LED illumination for imaging most common fluorescent stains. Users have access to both microsecond switching via multiple TTL inputs and the ability to mount inline excitation filters. This, when paired with today's high performance multi band filter sets, facilitates imaging traditionally done via a white light source and a filter wheel, with all the benefits of LED.
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Modulatable Lasers
06-01 Series
*Plug and play ultra-compact diode lasers (MLD) and diode pumped lasers (DPL)*405 nm, 445 nm, 473 nm, 488 nm, 515 nm, 532 nm, 553 nm, 561 nm, 633 nm, 638 nm, 647 nm & 660 nm*Up to 250 mW, integrated electronics*Fiber pigtailed option*Optional integrated clean up filter*Fast and high aspect ratio option, modulation up to 150 MHz*Perfect for fluorescence microscopy, flow cytometry
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Microscopy and Automation Solutions
Opto already offers automated multifluorescence microscopes for cell analysis, inverted autofocus microscopes for motion analysis of growth processes, and high- throughput fluorescence microscopes for DNA and RNA sequencing.
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Illuminators
ScopeLED B-Series
ScopeLED's B-Series microscopy illuminator replaces conventional halogen light sources used for brightfield, darkfield, phase contrast, polarized light and DIC in transmitted and reflected light applications. The heart of the B-Series illuminator is Di-Con's Dense Matrix high performance LED array. Using advanced thermal design, it offers vibration-free, fan-less cooling with a high intensity optically stable light output.
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Contamination Analysis
Contamination Analysis, which begins with a set of basic evaluations that on most occasions will answer the “What is this?” question. The protocol contains four parts:*Visual Examination*Organic Analytical Testing by Fourier Transform Infrared (FTIR) Spectroscopy*Elemental Analytical Testing by Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS)*Ionic Analytical Testing by Ion Chromatography (IC)
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Analysis via Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS)
The use of Scanning Electron Microscopy / Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in the analysis of failure related issues of printed circuit boards (PCBs), assemblies (PCAs), and electronic components (BGA, capacitors, resistors, inductors, connectors, diodes, oscillators, transformers, IC, etc.) is a well-established and accepted protocol. As opposed to or simply in addition to normal optical microscopy, SEM/EDS allows for the “inspection” of areas of interest in a much more informative way.
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Digital Microscopes
TAGARNO digital microscopes give you unique and easy to use magnification equipment to use in a variety of quality control processes as well as R&D efforts or in your repair and rework in an endless range of segments. The digital microscopy camera technology enables you to see any small object in ultra sharp magnification and to document your work with just a single click. It also allows multiple viewers at the same time and thereby greatly improves collaboration.
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Fluorescence Imaging
A next-generation fluorescence lifetime imaging microscopy (FLIM) camera that simplifies FLIM for researchers and imaging centers by combining excellent light sensitivity with easy image acquisition and data analysis.
