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- Optomistic Products
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LED Test
Universal LightProbe Penta sensors are Optomistic Products' most popular LED test sensor, relied upon for their versatility in accommodating most LED test applications for color and intensity. The Penta Sensor provides analog voltage outputs, and features built-in color binning, eliminating the need to convert LED wavelength to visual color in the ATE software, and saving valuable processing time. For use with any of the Universal LightProbe Fiber-Optic Probes.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Packaging Manufacturing
KLA’s extensive portfolio of packaging solutions accelerates the manufacturing process for outsourced semiconductor assembly and test (OSAT) providers, device manufacturers and foundries for a wide range of packaging applications. Innovations in advanced packaging, such as 2.5D/3D IC integration using through silicon vias (TSVs), wafer-level chip scale packaging (WLCSP), fan-out wafer-level packaging (FOWLP) and heterogeneous integration as well as a wide range of IC substrates create new and evolving process requirements. KLA offers systems for packaging inspection, metrology, die sorting and data analytics focused on meeting quality standards and increasing yield before and after singulation. SPTS provides a broad range of etch and deposition process solutions for advanced packaging applications. Orbotech offers a portfolio of technologies that includes automated optical inspection (AOI), automated optical shaping (AOS), direct imaging (DI), UV laser drilling, inkjet/additive printing and software solutions to ensure manufacture of the highest quality of IC substrates.
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Analog IC test system
A paradigm shift has been occurred in Japan’s major brand WL25 series tester. Ultimate simple system is available by effective analog pin architecture.This cost performance system is covered analog IC extensively, which are high accuracy, speed and multi-site test function.
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Low Noise Test Leads For N1413 With B2980 Series, 3m
N1425B
The N1425B is designed to operate specifically with the B2985B/87B. It can hold DUTs with large terminals being used with the N1426C. The N1426A with the N1425B is available for measurements of small DUTs such as PC boards or IC sockets. The N1426B with the N1425B enables the construction of simple custom-made test leads. The N1413A High Resistance Meter Fixture Adapter is also required to connect the N1425B to the B2985B/87B.
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Dual PCM Tester
MS-177
This equipment is used for PCM function test to check thestate ofsingle IC PCM as well as dual IC PCM. It is applied for only 1Cell PCM and can consist ofup to 40 Channels.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Emulation & Test Interface
Solder down modules to suit any package type provides a cost effective solution for replacement test heads, male or female. The mating top modules can incorporate either a ZIF or standard IC socket and the addition of optional test pins if required from RS Components.
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Wireless Test Solutions
Adivic/Chroma Group has been in the development of RF & Wireless test solutions for more than a decade. Take RF Recorder as an example, it has been adapted by all major Japanese & Korean automotive brand names such as Mitsubishi, Honda, Hyundai,.. ,most of the global IC design houses with DTV chips, and also military entities in NATO. With the same customer-proved Software Defined Radio architecture, we have introduced Wi-Fi, Bluetooth tester since 2014. It will soon cover other current/future wireless standards such as 4G/LTE, 802.11ax, 802.11ah, etc.
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High-Density Precision SMU (10 PA, 30 V)
PZ2131A
The Keysight PZ2131A is a high-channel density precision source / measure unit (SMU) having 5 channels per module and saving space for a wide range of applications requiring numerous precision power supplies. The narrow-pulse function and fast Digitizer Mode allow the PZ2131A to expand the conventional static DC measurements to emerging dynamic measurements. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2131A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2131A suitable for noise-sensitive applications such as quantum computing as well.
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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600A Digital Clamp Meter
7128B
Peaceful Thriving Enterprise Co Ltd
This is a auto-ranging, high accuracy and stable hand held clamp meter to make electrical maintenance safe and easy. With special designed IC to support true RMS, the meter is available to measure AC/DC voltage to 600V, AC current to 600A and resistance to 60MΩ; also having the capability to test diode, continuity and non contact voltage sensing. Sub switch included Function Select, Max-Min Indication, Value Hold, Range Select, Relative Value Measurement, Inrush Current Indication, Illumination and Back-light.
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DC Electronic Load
Model - KM-mPD-501
Kusam Electrical Industries Limited
KM-mPD-501 DC electronic load mainly focuses on the testing of power circuit on PCB. KM-mPD-501 offers a solution for function test of Switch step up, Stepdown, Regulators and Driver IC . Engineer puts components, such as CPU, DSP, FPGA; etc on a PCB after the power circuit has been tested. It’s not complete to use a meter to measure the voltage. KM-mPD-501 offers engineer OVP, OCP and OPP functions that help engineer know the value of overload current . On the other hand, engineer can use a programmable DC power supply (mPP series) to offer external power and connect PCB’s output to KM-mPD-501. Then engineer can easily get output watt, figure out the efficiency of power circuit and check if inductances, capacitances and resistances perfectly work with the power circuit. KM-mPD-501 not only offers loading emulation of current but also provides OVP and OPP. User can use these functions to test solar power battery, rechargeable battery and motor driver. In school laboratory, KM-mPD-501 helps students do experiment on power circuit, linear circuit and driver circuit.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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High Current IC Test
C.C.P. Contact Probes Co., LTD.
Our patented probe design allows very high currents of up to 5 Amps
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Failure Analysis
A partial list of our state of the art test equipment, applicable to these testing disciplines, will include the following: Two Scanning Electron Microscopes with EDS (SEM/EDS) Three Differential Scanning Calorimeters (DSC) Three Thermogravimetric Analyzers (TGA) Three Thermo Mechanical Analyzers (TMA) One Dynamic Mechanical Analyzer (DMA) Two Real-Time Fluoroscopic X-ray Systems, including a Microfocus System One Fourier Transform Infrared Microscope (FTIR) (capable of identifying a single particle of an unknown material) Two Ion Chromatographs (IC) (capable of identifying ionic impurities in ppm)
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Probe Cards
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Analog & Digital Mixed Signal IC test System
QT-8000 Series
Tester is applicable to regularDC/AC parameter testing and IC device performance testing. Main application: Power Management; Digital Consumer Products; Communication& Interface; Automotive; Energy Conservation electronics; Standard Linear Circuit; Memory; CPU Chips; Special Customized IC and Wafer Test.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5114
Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Pin Point Range Systems
The PinPoint Alpha system is a flexible, adaptable and modular PCB and IC fault finding system, which allows you to apply different electronic test methods to obtain maximum test coverage and fault detection. Test signals can be applied at the PCB edge connector or through test clips and DTIs to perform fixtureless in-circuit testing.
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Advanced Design System (ADS) Core
W2200BP
Advanced Design System (ADS) is the flagship product from Keysight EEsof EDA, the technology and innovation leader in high-frequency, mixed-signal electronic design automation (EDA). It is the only design simulation platform that enables the co-design of IC, package and board in high-frequency and hi-speed applications. ADS seamlessly integrates system, circuit, and full 3D electromagnetic simulation with Keysight's test instrumentation to perform single pass successful electronic designs repeatedly.
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Heavy Duty Dynamometers
MD-250-HD
The MD-250-HD series dyno (SE/DE) was designed to be a performance dynamometer first with the added benefit of being able to test 2-wheel-drive heavy-duty vehicles such as truck, buses and commercial vehicles in addition to the standard car or light duty pick-up. The 250-HD is certified in the states of Colorado, Nevada and Utah for use in loaded-mode diesel smog testing programs because of its accuracy and reliability. No other dyno in its class offers more value or better in-house motor vehicle testing capabilities than the Mustang MD-250-HD. For starters, the MD-250-HD boasts a 1,500 horsepower measurement capacity at a top speed of 175 mph and a powerful air-cooled eddy current brake provides the MD-250-HD-SE with 900-hp worth ofloading capacity for steady state testing. Loading capacity can be increased to 1,500-hp via the optional DE model. The 250-HD can be upgraded to the 250-HD-SE-M via the addition of a 100 or 200 hp AC motor for transient testing of electric buses to measure range and regeneration or for emissions testing of IC engines. Do not be fooled by its compact size – the MD-250-HD is a serious dynamometer with serious tuning capabilities. The MD-250-HD uses a powerful eddy current power absorber, a frictionless, air-cooled braking device, to enable it to apply variable and steady state loading. A complete control and data acquisition system lets you design a wide range of tests or select from a host of pre-configured tests included with the standard system. The 250-HD’s four roller design makes setting up vehicles a snap – simply drive onto the 250-HD and let the tires settle in between the rollers. The 250-HD can be installed above-ground or below-ground, it’s your choice. The above-ground system utilizes an optional premium platform and ramp system with an above-ground restraint kit. The addition of an axle pull-down kit help keep the tires from slipping or trying to “climb out” of the rollers.
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Steam Aging Tester
Wewon Environmental Chambers Co, Ltd.
These steam aging chamber applied for the testing of sealing property for multi-layer circuit board, IC sealing package, LCD screen, LED, semi-conductor, magnetic materials, NdFeB, rare earths and magnet iron, in which the resistance to pressure and air tightness for above mentioned products can be tested out. ● Overall of the steam aging tester made of stainless steel SUS # 304HL, simple operation settings. Microcomputer digital LED control with time planning function , the maximum set 9,990 Mins. ● Parts, connectors, passive components , semiconductors oxidation test pin high temperature and humidity. ● Metal pin soldering test accelerated aging test. Multiple overtemperature protection / water cut heating and other safety devices. ● The touch- PID + SSR temperature controller, timer function while a time , set the 9990 maximum fractional unlimited.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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PXIe Digital Stimulus/Response with PPMU: 250 MHz, 16 Channels
M9195B
The Keysight M9195B PXIe digital stimulus/response (PXI DSR) module is ideal for IC design validation and production test environments. The PXI DSR provides 16 bi-directional digital channels with programmable logic levels and can be configured for synchronized cyclized digital data, for parametric measurements, or for static digital IO.
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Dip Clip, 14 Pin With Nickel Silver Contacts
5014
Pomona DIP Clip test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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Test Socket Based Elastomeric Matrix Connectors
Z-Axis offers a wide range of high performance test sockets, which are based on our elastomeric matrix connectors, for wide range of IC packages (BGA sockets, LGA sockets, etc.), coaxical, and wafer level; and for testing high speed, digital, analog, and RF signals etc.
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Surface Mount-to-DIP JEDEC SOT-25, SOT-23A-6 Adaptor
1110748
Surface Mount to DIP Adapter for SOT-25, SOT-23A-6. Allows for breadboarding or substitution of microgate SOT-23A-6 and SOT-25 IC and transistor packages into .100 [2.54] pitch proto boards or PC boards. Solder masked top-side pads allow user to hand solder devices directly to topside of adapter with fewer problems of solder bridging. Longer male bottom pins are available at special request for easy use of probe clips. Large topside pads allow for soldering test pins, jumpers, etc. to top of adapter.
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