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ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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ICT Probes
Merica Series-MPA75
Minimum Center: 1.91 (75mil)Current Rating: 3amps, continuousCurrent Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 198gf(7oz)
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Universal Test System
LEON System
A universal ICT, FCT, ISP and Boundary Scan platform.Based on the ABex platform, which directly integrates Konrad analog bus technology and PXI/PXIe in one chassis, the LEON platform can be configured to solve various test challenges. Due to this architecture only one system provides the complete test flow combining ICT, ISP, Boundary Scan and FCT.Various form factors and configurations allow a perfect combination between cost, speed and test coverage. The modular architecture provides the possibility to reconfigure or upgrade the systems based on your test needs.The LEON System software provides a powerful development and test execution environment which directly supports NI TestStand. All systems and components could be integrated into third party software using supplied APIs.
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GPON OLT
OLT-G4V
Hangzhou Softel Optic Co., Ltd.
OLT-G4V series GPON OLT products are 1U height 19 inch rack mount products. The features of the OLT are small, convenient, flexible, easy to deploy, high performance. It is appropriate to be deployed in compact room environment. The OLTs can be used for “Triple-Play”, VPN, IP Camera, Enterprise LAN and ICT applications.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Modular Relay Board
Alliance Support Partners, Inc.
An increasing number of electronics products are being assembled in panels of 8 or more to minimize production cost. These products are typically tested with in-circuit tests (ICT) followed by power-on functional tests. Normally, ICT requires isolation of power and ground while measurements are being performed. Functional tests, including in-system programming (ISP), require board power to be applied. The Modular Relay Board (MRB) is designed to switch power onto each individual board and to disconnect sensitive signals during functional test.
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In-Circuit Testers
SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ICT Probes
Merica Series-MPAL50
Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 185/227gf(7/8oz)
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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Inline test system for FCT, ICT, ISP and Boundary Scan for Automated Operation
LEON InLine
High production volume often requires inline solutions with fully automated product Handling – the LEONlnline is a complete Inline Board Test Solutions for printed circuit boards. It integrates a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors.
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LED Analyser
The Feasa Analyser is an innovative solution for testing multiple LEDs simultaneously for Color and Brightness. There are two Models, Feasa-I(ICT) and Feasa-F(Functional). These can be ordered in 3, 5, 10 and 20 Channel configurations.
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QAM And PCM Analyzers
GAOTek provides a wide range of high performance and inexpensive QAM/PCM analyzers. Quadrature amplitude modulation (QAM) and pulse code modulation (PCM) analyzers are convenient instruments with top to bottom estimations and adaptable setups. Additionally, these devices have integrated functions of analog signal generators/receivers, BERT, signaling generators/receivers, selective level meters, ring generators/ identifications, dialers, DC loop circuits (ICT, OGT), balanced bridges and reflecting bridges into solitary instruments. These analyzers are ideal for installing and maintaining digital and analog networks.
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Universal Off-Line Handler
OLS Series
Developed as an economical and versatile solution, it adapts to any offline test application - ICT (In Circuit Test), ISP (Flashing) or FCT (functional). The design of this solution allows the quick and ergonomic change of fixtures , with a change time of less than 3 minutes.
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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Automated ICT System
With world-famous in-circuit test technologies and innovations around automated inline handlers, Keysight automated inline ICT solutions are versatile and flexible and provide you:
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
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6TL29 Semi-Automated Test Platform
AQ377
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
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Mini In-Circuit Test System
U9403A
The Keysight Mini ICT is a true in-circuit test unit in the rack that can be used standalone or integrated. It comes with a full set of Keysight ICT test features, from VTEP vectorless test, Cover-Extend Technology, to digital library tests and boundary scan. The unmuxed per-pin programmable digital engine makes test development really flexible and easy, especially in a situation when device conditioning is needed in functional test.
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In-circuit and functional Tester
Compact TK
This is the smallest configuration , and is generally recommended for ICT and on-board programming applications. It is characterized by a high level of ergonomy, small footprint, easy maintenance , low power consumption and enhanced operator safety.
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Functional & ICT Tester
igentic® 621t
Growing demand for light emitting diode (LED) products and increasing testing complexity continue to challenge electronic printed circuit board (PCB) manufacturers. The igentic® 621t is a flexible PCB tester that ensures quality while increasing production. The tester can handle multiple PCB products and test for light measurements, resistance and push button or post detection, as required.
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Utility Card: Flash Programming Applications
This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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Tooling And Fixturing
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
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Spring Contact Probe
ICT
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
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Board Test Fixture Probes
Offering a wide range of standard spring contact probes to meet your testing requirements and has long been recognized as the world’s largest probe manufacturer. With over 60 different probe series ranging from 0.02" (0.51 mm) to 0.187" (4.75 mm) pitch with multiple length, travel, ICT, lead free and rotator options, we provide a full portfolio designed for general purpose test on bare boards, loaded printed circuit boards and surface mount assemblies.
