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- Applied Rigaku Technologies, Inc
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Affordable EDXRF Analyzers
NEX QC Series
Applied Rigaku Technologies, Inc
NEX QC is the lowest cost variant of a line of affordable benchtop EDXRF spectrometers designed for rapid qualitative and quantitative analysis of elements from sodium (Na) to uranium (U) in solids, liquids, alloys, powders, and thin films. For more demanding applications, or for situations where short analysis time is critical, we recommend the NEX QC+ spectrometer. Employing the next generation silicon detector technology, the enhanced NEX QC+ affords significant improvement in elemental peak resolution and counting statistics.
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Falling Dart Impact Tester
DRK135A
Shandong Drick Instruments Co., Ltd.
DRK135A Falling Dart Impact Tester is applicable in the impact result and energy measurement of the falling dart from a certain height against plastic films and sheets with thickness less than 1mm, which would result in 50% tested specimen failure.
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Coating Thickness Gauge
Shenzhen Linshang Technology Co., Ltd.
Linshang coating thickness gauge, also named dry film thickness gauge, which can identify the substrate automatically. It can be used in various fields such as coating thickness measurement, plating thickness measurement, fireproof and anticorrosive coating thickness measurement, etc. The dual-use coating thickness gauge such as LS220H, LS221, LS223 are suitable for ferrous and non-ferrous substrates, LS225+F500 is special for ferrous substrates and LS225+N1500 is special for non-ferrous substrates.
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Film Frame Handler
FH-1200
Universal testing capabilities for film mounted strip handling. It works with semiconductor test devices including QFN, BGA, CSP and WLP to assure the highest first pass yields available by enabling increases from 1% to 10%+ through precise contactor alignment and device positioning accuracy. Supported by a cutting-edge data management system and analysis software, FH-1200 includes Smart-Track and Smart-EM – your “Virtual Process Engineer” – to handle electronic strip mapping, process control and data management.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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Thick Film Passive Element
GBR-253
GBR-253 series high voltage resistors are made in a thick film technology on ceramic substrates (Al2O3 96%). These elements are used in high voltage applications requiring high stability and resistance.
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Digital Coating Thickness Gauges
The Elcometer range of digital coating thickness gauges has been specifically designed to provide highly accurate, reliable and repeatable coating thickness measurements on almost any substrate, whether ferrous or non-ferrous. Dry Film Thickness can be measured on either magnetic steel surfaces or non-magnetic metal surfaces such as stainless steel or aluminium using a digital coating thickness gauge. The principle of electromagnetic induction is used for non-magnetic coatings on magnetic substrates such as steel. The eddy current principle is used for non-conductive coatings on non-ferrous metals substrates.
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Programmable Step Attenuator, DC to 26.5 GHz, 90 dB, 10 dB steps
84906K
The Keysight 84906K programmable step attenuator offers coaxial measurements to 26.5 GHz in a compact, rugged design. It offers repeatability of better than 0.03 dB, excellent life (greater than 5 million switching cycles per section) and an attenuation range of 0 to 90 dB in 10-dB steps. This latest design evolution sets new standards for size and performance. High attenuation accuracy and low SWR are achieved through the use of miniature thin-film attenuation cards composed of high-stability tantalum nitride film of saphire substrate. Insertion loss is outstanding, with less than 2 dB of loss at 26.5 GHz. The compact size of the unit, 35 percent smaller than the Keysight 8495/7 (26.5 GHz) family, allows for easy integration into instruments and ATE systems.
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Portable Detectors
Portable holiday detectors are designed for various pipeline, plant, and other surface applications where the inspection surface remains stationary and the detector is moved over the inspection surface. High voltage detectors are used for thicker surface coatings, such as those used on pipelines and other industrial applications. low voltage, wet sponge detectors are used for thin film applications.
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C-Band / L-Band MWDM
WD1615/C, WD1516/L
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
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100GHz Single Fiber Bi-Direction Dense WDM
DWDM-1200
Hangzhou Huatai Optic Tech. Co., Ltd.
Huatai DWDM-1204, DWDM-1208 dense DWDM DWDM, which is based on mature thin film filtering technology, It has the feature of low insertion loss, high isolation and flexible channel configuration. It can bi-direction transmit 4 channel(1204) or 8 channel(1208) on one fiber up stream/down stream.
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Water Vapor Permeability Tester
WPT-304
WPT-304 Water Vapor Permeability Tester is manufactured based on the gravimetric method and is applicable to test the water vapor transmission rate of plastic films, composite films, sheets, and other materials used in packaging, medical and constructive industry.
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Soil Heat Flux Sensors
Soil heat flux sensors may consist of several thermocouples whose measurements are averaged, a single thermopile, or a single thermopile with a film heater. These sensors measure the rate of energy transferred through a surface. Data regarding the amount of energy stored in soil as a function of time is used in energy-balance and Bowen-ratio flux systems.
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Peel Strength Testing
Peel Strength Testing is the average load per unit width of bond line required to separate bonded materials where the angle of separation is 180⁰. Peel testing is one way to characterize adhesive bonds. It is used extensively to evaluate the bonding strength of tape, adhesives and flexible substrates, including rubber, films, biomaterials, dental materials, medical packaging and consumables. Typical tests involve peeling two bonded flexible adhered from each other, or peeling a flexible bonded adhered from a rigid substrate. Peel tests are usually conducted at a constant rate at various angles, with 90° and 180° being the most common. Parameters such as peak peel load, average peel strength and statistical measures of peel strength variability are typically used to characterize behavior under peel loading.
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Thin Film
Bourns precision thin film resistors have tight resistance tolerances, extremely low temperature coefficiency and wide range of resistance value which makes them ideal for high precision applications. Excellent stability, low noise characteristics are achieved by using thin film sputtering technology on ceramic substrates and high precision laser trimming process.
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Low Resistance Metal Film Chip Resistor
RTX
This specification is applicable to lead and halogen free RTX series low resistance metal film chip resistors. Lead free products mean lead free termination meets RoHS requirement.
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Hot Tack Tester
Guangzhou Biaoji Packaging Equipment Co., Ltd.
GBPI Hot Tack Tester To test the sticking strength of packaging films after heat sealed with different temperature, pressure and time. It simulates the use of packaging bag and makes impact experiment on the part of hot tack.
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C-Band 1510nm BWDM
WD1510
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1510 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to WDM network to achieve the combination and separation of C-Band 1510nm (±10nm, monitor and control channel).
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SPI Flammability Tester (Vinyl Material)
TF318
TESTEX Testing Equipment Systems Ltd.
SPI Flammability Tester (Vinyl Material), to determine the ignition properties of vinyl plastic film material according to CFR 16 Part 1611 U.S.A. Flammable Fabrics Act for flammability of apparel vinyl plastic film.The rate of burning shall not exceed 1.2 in./s as judged by the average of five determinations lengthwise and five determinations transverse to the direction of processing, when specimen is placed at an angle of 45 degree and expose to the standardized flame (22# fire nozzle, 1/2 inch. In length).
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Motorized Force Test System
MT Series
In the past, film extruders, paper producers, converters, and woven/non-woven fabric producers have had the choice of test stands and universal test machines which are either value-priced peak-force-only machines, or expensive computer-operated integral-load cell machines. Now you can have the best of both worlds in a single instrument. The series MT-1500, a simple to use computer operated tester, with Quality Control software for automatic calculation and graphical display of break, elongation, yield, modulus, and other, tension and compression force information.
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Coating Thickness Gauge
456
The Elcometer 456 dry film thickness gauge is available in four different models. Each thickness gauge provides the user with increasing functionality - from the entry level Elcometer 456 Model E, to the top of the range Elcometer 456 Model T.
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High Voltage Pulse Attenuators
Barth High Voltage Pulse Attenuators are matched impedance coaxial attenuators for use primarily in pulsed 50 ohm systems, or where occasional transients would damage ordinary units. The attenuator design closely matches the impedance around each resistor, to that resistor. These attenuators feature an input impedance very close to 50 ohms, with characteristics as good or better than most microwave attenuators. These units are ideal for use in nuclear and high energy experiments. Extensive testing during manufacturing insures very high reliability for single-shot experiments. A voltage coefficient of the resistive film of less than .0001 %/V allows low voltage calibration of most systems.
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WDXRF Wafer Analyzer
2830 ZT
The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, the 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.
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Wet Film Wheels
3230
By rolling the gauge through a wet coating, the centre wheel eventually touches the film. This point on the scale indicates the thickness.
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Long Travel Extensionmeters
The Instron model XL (long travel) extensometer is a precise device for measuring strain in highly extensible materials such as elastomers, semi-rigid plastics and films. Designed for use with electromechanical testing instruments, Instron XL units can be used to measure specimens elongation's up to 10 in or 250 mm. An optional of 15 in or 375 mm travel is also available.
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Fork Sensors
Leuze electronic GmbH + Co. KG
Fork sensors combine transmitter and receiver into a single device and therefore feature high operational reliability. They are characterized by simple mounting without the need for alignment as well as high sensitivity. The fork sensors are used for detecting small parts or for detecting labels and print marks, even on transparent films.
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Scatterometer with Thin Film Measurement Capabilities
OptiPrime-X Series
The n&k OptiPrime-X series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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GHz Vibration Observation
Laser based observation system specially designed for visualization of surface acoustic wave (SAW) and Bulk Acoustic Wave (BAW) of Dielectric / Piezoelectric based high frequency devices, such as SAW filters (Interdigital Transducer (IDT)) and Film Bulk Acoustic Resonators (FBAR).
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Semi-Automatic Probe Sheet Resistance/Resistivity Measurement
CRESBOX
• Multi-points measurement and Mapping display- 2-D map / 3-D map graphic display- Multipoint pattern measurement is programmed (maximum 1225 points) and random pattern is programmable by operator.• Film thickness conversion function from sheet resistance• Measurement data base link with Excel via CSV format file• Software language can be switched in English /Japanese by operator
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Flashlight Solar Simulator
Flashlight Solar Simulators have the advantage of negligible temperature change to the solar cell. For this reason, they are primarily used in cell and module production environments. Also, they are a more budgetary alternative if large cell areas are to be illuminated, because it is easier to have excellent light uniformity on areas of 8 in x 8 in or larger. So, this type of solar simulator is also used for analysis of large area thin film solar cells. But care must be taken, as some materials (e.g. CIGS) have long inherent time constants, so that the pulse length (better: flash plateau) must be chosen accordingly.
