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Defect
other than specified, imperfection .
- Pickering Interfaces Inc.
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PXI Fault Insertion Insertion Switch Modules
Our PXI Fault Insertion Insertion Switch Modules feature a breakout arrangement that allows faults to be attached to the sensor lines, this includes the breaking of a connection or the adding of defect – all of which can simulate connectivity problems in the system.
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Pinhole Detection Devices
ElektroPhysik Dr. Steingroever GmbH & Co. KG
The coating control by means of pore testing makes use of electrical voltage in order to uncover microscopically small defects (> 20 μm) in the coating of a surface. If even a small defect can be detected during pore testing of surface coatings, urgent action is required. Minimal flaws in the coating are sufficient to cause great damage.
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PXI Fault Insertion Matrix Modules
All of our fault insertion matrices feature a breakout arrangement that allows faults to be attached to the sensor lines via the Y axis. This includes the breaking of a connection or the adding of a series defect – all of which can simulate connectivity problems in the system. The three pin breakout versions allow the connection to be swapped for a “bad” sensor simulation.
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Non-Destructive Surface Testing of Ferromagnetic Steel Bars
CIRCOFLUX Product Family
Foerster Instruments, Incorporated
The CIRCOFLUX test system is used for the non-destructive surface testing of ferromagnetic steel bars using the magnetic flux leakage method in accordance with standard EN 10221. This method is the most sensitive surface testing method for longitudinal, crack-like defects in hot-rolled ferromagnetic steel bars. The CIRCOFLUX sensor system therefore replaces subjective testing methods such as the magnetic powder test (magnetic crack detection) and visual checks, which are difficult to document and reproduce.
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MPI Sorter Series
MPI’s Sorter Series are improving production efficiency and yields for market sectors related to LED chip, package production, discrete device handling, and IC substrate manufacturing. Deploying MPI’s Pick & Place technology, the Sorter Line offers dedicated sorting and defect inspection solutions particularly suited for GaN, GaAs, Vertical LED Chip, Flip Chip, and Laser Diode applications. With a proven heritage of and market-advanced technologies, MPI offers competitive and differentiated solutions that are scalable and cost-effective.
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Thermal Imager with App
testo 872
The testo 872 thermal imager is ideally suited for professional industrial and building thermography - at the same time it ensures your work is both quick and easy. It is versatile to use, for example in industrial and mechanical maintenance or for detecting structural defects. You can generate error-free and objectively comparable infrared images using its handy functions. The IFOV warner, testo -Assist and testo ScaleAssist mean you can avoid measurement errors and not only effortlessly achieve optimum setting of emissivity () and reflected temperature (RTC) for building thermography, but also of thermal image scale.
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Weatherometer with Air Cooling System, 80 Liters, 175 Liters, 225 Liters
Wewon Environmental Chambers Co, Ltd.
Weatherometer test is important to bring out the defects in something and to ensure its durability. The weatherometer result will make us identify those areas which need immediate improvements. But, there are areas where basic testing is not enough and does not do the job perfectly. To meet the high quality requirement, there is a need to perform extensive weatherometer testing on some materials. A place where such kind of testing is conducted is the xenon weatherometer.
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Portable Eddy Current Flaw Detectors
Portable eddy current (EC) flaw detectors inspect metallic parts and perform highly reliable and advanced flaw detection of surface and near-surface defects. Olympus offers portable eddy current equipment to meet a broad range of applications, including the detection of surface or near-surface defects, and the inspection of bolt holes.
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Advanced Metrology System
NGS 3500L
This top performance system is designed for applications where high-speed defect detection and precision measurements on wafers and other parts are required. It is well suited for use as a dedicated production tool or as a versatile processdevelopment system. It features a powerful set of automated as well as semi-automatic optical/ video tools optimized for high accuracy, production throughput, and ease of use.
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Composite Damage Checker
35RDC
The handheld 35RDC is a simple Go/No-Go ultrasonic instrument designed to detect subsurface defects caused by impact damage on solid laminate aircraft composite structures. The 35RDC features a backlit LCD that displays the word GOOD if no subsurface damage is found or the word BAD when it detects subsurface damage.
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Machine Vision Camera
Mako
Mako cameras feature the latest CMOS sensor technologies from renowned manufacturers (Sony, CMOSIS, e2V, Aptina, OnSemi Python). Always get the best image quality for your application with a choice of camera models from VGA to 5 megapixel resolution, and frame rates up to 550 fps. Choose between two plug-and-play interfaces (GigE VisionTM or USB3 VisionTM) for an easy integration into standard image processing systems. Mako camera offer advanced features including camera temperature monitoring, pixel defect masking, separate ROI for auto features for all your application requirements.
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Partial Discharge Testing Equipment
PD-Analyser
This is an ‘All in One’ solution for testing and analysing partial discharges in the insulation of high-voltage transformers, cables, GIS and electric machines. The DIMRUS ‘PD Analyser’ help diagnose their insulation state and find any type of defects very effectively.It can be used for temporary or constant monitoring of partial discharge in medium and high voltage systems and cables of any rated voltage.The PD Analyser is the most useful device for condition estimation of high-voltage insulation. This multipurpose device is designed for -Partial discharge measuring in high-voltage insulation at a high noise level.Fast detecting of the defects in different high-voltage equipment and identifying how dangerous they are.
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Contour Check Shape
Contour Check Shape has proven itself in hot rolling of long products and is an essential part of the rolling process in many factories. It checks hot and cold steel profiles with the help of three-dimensional surface reconstruction. Thus, it records geometrical errors due to rolling defects including surface defects like scale seams, shells or roller outbreaks.
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Automatic and Accurate Inspecting Systems
Circuit AOI
The Circuit AOI system is designed to perform automatic and accurate inspecting systems. It integrates rigid mechanical system with advanced vision technology and manufactured and tested by strict is standards. It is suitable for circuit inspection for PCB/FPC, verification and repair. Innovation and unique inspection algorithms are applied to inspect open, short, protrusion, nick, scratch, pin hole, island, line width/space violation, object missing and others defects. AOI system can use offline setup project and check results. It will improve the throughput.Compare to halogen lighting, the full angle LED lighting of Circuit AOI can obtain the best image contrast and is good for different panel type inspection.
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Reticle Manufacturing
An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.
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Edge and Backside Inspection
LIGHTnPS
• Best in class throughput• High surface sentivity• Full haze characterization• High lifetime / low CoO solid state laser• Advanced Automatic Defect Classification
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3D CT AXI
PCB manufacturers can enjoy comprehensive, high-speed inspection with Omron’s revolutionary technology that reliably captures defects in hidden areas.
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Defect Inspection Systems
Candela® defect inspection systems detect and classify a wide range of critical defects on compound semiconductor substrates (GaN, GaAs, InP, sapphire, SiC, etc.) and hard disk drives, with high sensitivity at production throughputs.
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Wafer Internal Inspection System
INSPECTRA® IR Series
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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Electroluminescence Test Systems
The products of the SolarModule EL-inline family are integrated into a module production line, before lamination, after lamination or at the end directly after the performance measurement. High-resolution cameras provide excellent image quality and allow the automatic detection of relevant defects. A manual evaluation of images is no longer necessary, which means that considerable costs can be saved. Communication to upstream and downstream processes is flexible and can be adapted to all common interfaces.
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PocketDetect HR
PocketDetect HR
Hachmann Innovative Elektronik
With a PocketDetect HR you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
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Automated Excise Stamp Control System
Kama
The automated control (verification) system of excise stamps allows for blotting accounting of alcohol, dairy and other products (inspection of the readability of DataMatrix, PDF, QR, Barcode and other barcodes of excise or federal stamps) at a speed of up to 20 pcs / s. This visual inspection allows you to quickly identify defects in DM and PDF printing. The recognition system also analyzes gaps and doubles in a sequence of codes. The system has its own mechanism for rewinding a roll with a volume of up to 5000 marks. All types of stamps (old and new, large and small) are supported. Wide range of options for configuring scanning parameters and automatic generation of reports for the EGAIS department. Possibility of manual scanning (by hand scanner).
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SlipFinder
YIS and SF Series
The YIS and SF Series metrology systems are designed for optical detection of wafer defects such as crystaldislocations, slip and other defects. The YIS-300HM (for 300 mm wafers) and YIS-200HM (for 200 mm wafers) utilizeMakyoh optics technology (Magic Mirror) and integrated robotic wafer handler provided by Hologenix.The SF300M and SF300N systems offer a low cost functionally equivalent alternative to the YIS series.
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Oil Immersed Test Transformer
SG-YD
Wuhan Sangao Electrical Test Installations Limit Co.
AC and DC test oil immersed transformer.Traditional oil immersed test transformer is used to do power frequency withstand voltage and DC current withstand voltage test for variety kinds of high voltage electric device, insulating material.YD series oil transformer, also known as test booster, which test insulation strength under specified voltage for various electric products, components, insulation materials. It can test products insulation level, find insulation defect and judge overvoltage ability. It is widely used in power station, power supply and distribution system and research institute.
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Constant Acceleration Tester-Arm Type
KRD31 series
KRD31 series constant acceleration tester are used to test articles under extreme acceleration conditions based on standard like MIL-STD-810F, MIL-STD-202 and IEC68-2-7. It is most suitable for testing electronic components or devices. Under high g effect on microcircuits, to check adaptability and reliability of wiring and the internal structures. It may expose mechanical and structural defects that are not found with vibration and shock tests.
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Automated Optical Inspection (AOI)
TR7700 SIII 3D
TRI’s ground breaking 3D AOI solution delivers the fastest hybrid PCB inspection combining optical and blue-laser-based true 3D profile measurement for the highest automated defect symptom coverage possible. Integrated state-of-the-art software solution and third generation intelligent hardware platform offer stable and robust 3D solder and component defect inspection and with high inspection coverage and easy programming.
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Dinger™
The Dinger is a fast yet sensitive NDT (non-destructive test) system used for batch or 100% inspection of raw or machined metal cast, fabricated, sintered, forged, die cast, or ceramic parts. It’s built on our IQC foundation that’s in daily production use by customers worldwide, and has tested over a million parts. Dinger allows you to dramatically improve the shipped quality, by quickly and reliably identifying parts with either global or local manufacturing defects.
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Wafer Inspection System
INSPECTRA® Series
INSPECTRA® series meet the requests of 100% automatic inspection with high speed and high specifications from front-end to back-end of semiconductor processing. INSPECTRA® series are wafer inspection systems with high speed and high sensitivity. Our original "Die-to-Statistical-Image" comparison method achieves the target defects detection controlling process variation and overkill.
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Defect Isolation
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
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Receptacle Tester
RT500
Designed to detect the most common wiring problems in standard 120V receptacles.Test for correct wiring, open ground, reverse polarity, open hot, open neutral, hot and ground reversed.Conditions NOT indicated: Quality of ground, multiple hot wires, combinations of defects, reversal of grounded and grounding conductors.Large light indicators for greater visibility.Reinforced prongs for increased durability.Push-pull design with slip-resistance ribbing.Made in USA of U.S. and imported parts.
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Miniature Single Axis Accelerometers
Miniature piezoelectric accelerometers are required for applications demanding high frequency range, small size, and low weight. Product testing is necessary in today’s competitive marketplace in order to optimize designs, reduce defects, and improve customer acceptance and satisfaction. Shock and vibration testing offers a structured approach for verifying survivability in environmental influences that may be encountered during service and for precipitating incipient failures so they are not encountered by the end-user. PCB® accelerometers are used extensively for monitoring an object’s response to a programmed vibration input and for controlling the vibration profiles during testing.
