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CalPod Drive Cable, 40 GHz, 2 Meter
85553A
This cable provides the bias voltages and control signals for operation of the 40 GHz CalPod modules. This cable is supplied with the 85540/41/42A CalPod modules.
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Micro probes 1 MHz up to 1 GHz
MFA 02 set
The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
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DiodeTester
FECPLS500
Frothingham Electronics Corporation
The PLS500 automatic tester is designed primarily to do SURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses and THERMAL RESPONSE either in DVF (mV) or degrees per watt. All three test types may be performed in a single test program.
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.13u ESD diode
Impulse TSMC
The Impulse TSMC .13u ESD diode was made to provide ESD discharge paths when integrating third party IP in an integrated circuit design for total ESD protection. The Impulse ESD diode has been successfully used with Dolphin Technologies, Artisan/ARM, TriCN/Synopsis I/O libraries, as well as popular IP blocks from RAMBUS, Chip Idea and other quality IP vendors. A 5.5 volt reverse bias anode to cathode operational specification enables the Impulse TSMC .13u ESD diode to be the device of choice for 5 volt tolerant designs.
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DiodeTester
FECPLS510
Frothingham Electronics Corporation
The PLS510 automatic tester is designed primarily to doSURGE testing either as single pulses or with Forward and Reverse bias, according to methods 4066-1 or 4066-2. In addition, it can also test VF with rectangular pulses andTHERMAL RESPONSE either in DVF (mV) or degrees per Watt. All three test types may be performed in a single test program.
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DC BIAS CURRENT UNIT
3265B SERIES
To evaluate components at currents up to 125 A the 3265B DC Bias Units are used with either the Wayne Kerr 3255B series of Inductance Analyzers or the 3260B Precision Magnetics Analyzer. When one 3265B/25A or 3265BQ/25A DC Bias Unit is connected to an instrument up to 25 A of DC bias current can be set in steps of 25 mA with one unit. Additional DC Bias Units can be added such that with five units connected in parallel it is possible to set DC bias currents up to a maximum of 125 A DC.
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Biased and Unbiased HAST Testing
Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Integrated Balun Probes
This is an example of a 900 MHz Integrated Balun Probe. It incorporates a 50 ohm unbalanced to 200 ohm balanced differential transformer. The probe can be built with or without a center tapped ground needle and may also incorporate DC bias through the differential pair or via separate needle contacts.
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Variable Gain Amplifiers
Qorvo's variable gain amplifiers (VGAs) integrate high-performance amplifier solutions along with digital or analog gain control. Several of our VGAs integrate all of the RF matching and bias circuitry into a single package, providing a very compact solution and reducing PCB space.
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JTAG based Test & Flash Programming Services
We offer EMS companies and design houses services and solutions in manufacturing testing with bias towards JTAG (IEEE 1149.x Boundary Scan) and functional test: System-level DFT rule checking for production testing and inspection. Test strategy development and optimization for test cost reduction. JTAG, functional, and emulation-based test development and deployment. Product testing and troubleshooting services. Ultra fast in-system programming solutions (Flash, EEPROM).
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Impedance Analyzers
The E4990A Impedance Analyzer with a frequency range of 20 Hz to 120 MHz provides an industry best 0.045% (typ.) basic accuracy over a wide impedance range, with a 40 V built-in DC bias source.
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Components - Active Multipliers (FDA)
FDA Series
Farran offers a range of broadband varistor multipliers based on planar GaAs Schottky diodes. All devices are fixed-tuned and operate without bias. They offer high efficiency and full waveguide band coverage
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DC Current Bias Supply
DC1000A
To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.
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LCR Meter
ET/QuadTech 1910/1920
The 1920 1 MHz LCR Meter is the most popular and designed to perform capacitance and impedance measurements on a variety of electronic components and materials over a frequency range from 20 Hz to 1 MHz. The1920 features programmable bias voltage from 1 mV to 2 V for biasing capacitors and other semiconductor devices during measurements.
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*Divergent Light Measurement
The IS1.5-VIS-FPD-800 & IS1.5-IRG-FPD-800 contain 2 photodiodes: a calibrated photodiode for precise power measurement using Ophir meters and a fast photodiode with integral reverse bias circuit for temporal characterization using third-party instrumentation such as oscilloscopes and spectrum analyzers. Their small, 1.5" internal diameter preserves the temporal shape of pulses down to 3.5 nsec for VIS and 6 nsec for IRG. An SMA fiber optic connector is provided for connection to a spectrometer. The large, 20 mm input aperture allows for wide acceptance angles and long working distances, making these spheres well suited for testing VCSELs and other types of laser.
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wavefront sensors
HASO4 FIRST
HASO4 FIRST is the ideal choice for results driven professionals in domains including adaptive optics, optical process optimization, laser beam characterization, and many others. Thanks to our patented technology, the HASO family by Imagine Optic are world's only sensors with no bias error, keeping its phase accuracy on any measured intensity profile (Gaussian, Top-Hat, hyper Gaussian, etc.). The USB 3.0 connectivity and the ergonomic design allow an easy plug and play installation of the HASO4 FIRST in any application.
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O/E Converter
TIA-4000
The TIA-4000 is comprised of a fibre coupled InGaAs APD detector combined with a variable reverse bias voltage network and fast transimpedance amplifier. The output of the unit is brought out to a type K female SMA connector. Light falling on the detector generates a positive-going proportional current. This current, multiplied by the transimpedance produces a voltage that is proportional to the light incident on the detector surface.
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Microwave System Amplifier, 45 MHz to 50 GHz
83051A
The Keysight 83051A microwave system amplifier is a compact, off-the-shelf amplifier designed for systems designers and integrators. This amplifier provides power where you need it to recover system losses and to boost available power in RF and microwave ATE systems. The ultrabroad bandwidth from 45 MHz to 50 GHz allows the designer to replace several narrow bandwidth amplifiers with a single Keysight amplifier, eliminating the need for crossover networks or multiple bias supplies.
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Modular Power
RFP Controller
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Frequency Multipliers
Doublers
*no mechanical tuners*fullband operation*planar design*bias voltage required
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Gunn Oscillators
Gunn Oscillators are solid state microwave energy generators. These consists of waveguide cavity flanged on one end and micrometer driven plunger fitted on the other end. A gunn-doid is mounted inside the waveguide with BNC Connector for D.C. Bias.
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110 GHz Frequency Extender, Pulsed DC Bias
N5293AX52
The Keysight N5293AX52 is a broadband frequency extension module designed for use with Keysight’s new PNA / PNA-X-based millimeter-wave solutions. It is a compact, lightweight, and ruggedize frequency extender module with built-in bias tee for pulsed DC bias operation. It interfaces with the Keysight N5292A test set controller. The modules allow users to extend the frequency coverage of a base PNA / PNA-X Series network analyzers to a range of 10 MHz to 110 GHz. For more information about cable and accessories for use with network analyzers, please visit Network Analyzer Accessories.
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Bias Network, 100 MHz to 12.4 GHz
11590B
The Keysight 11590B broadband high power bias networks can be used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF port.
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Millimeter Wave Zero Bias GaAs Schottky Diode
HSCH-9161
The HSCH-9161 is suitable for medium-low barrier, zero bias detector applications. The HSCH-9161 is functional through W-band (110 GHz) and can be mounted in microstrip, finline, and coplanar circuits.
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Electro-Optic Modulators
Thorlabs’ selection of electro-optic (EO) modulators includes free-space and fiber-coupled LiNbO3 modulators. Free-space amplitude, phase, or resonant modulators can operate at speeds up to 100 MHz. We also offer liquid crystal EO modulators for speeds up to 2.5 kHz. Fiber-coupled intensity, phase, or IQ modulators for speeds up to 40 GHz can be driven by our EO modulator drivers. A modulator bias controller is also available for use with fiber-coupled intensity modulators.
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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SQUID Electronics
XXF-1
It is designed to satisfy the needs of nearly all low-Tc SQUID applications. Additional integrated current sources provide e.g. bias current and calibration pulses for TES applications. These current sources together with an additional switchable feedback path make two-stage SQUID operation very convenient.
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Bias Networks
RF and microwave bias networks are used in a wide variety of biasing applications for test and measurement requirements in laboratory and production environments. Bias networks provide the means of supplying DC bias to the center conductor of the coax connector for your device while blocking the DC to the RF ports.
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IVTS In-Vehicle Test Set
The in-vehicle test set was developed to successively measure several active RF amplifiers installed in the vehicle as well as different antenna structures. It offers the possibility to connect 12 DUTs. The DUTs can be connected to an external spectrum analyser via a 1 to 12 RF multiplexer. Each DUT can be individually switched and supplied with an adjustable voltage via a bias-tee integrated in the system. The individual bias voltages and currents are recorded by the IVTS and can be called up on an interactive control panel or via Ethernet and SCPI commands. The complete system can be powered by rechargeable battery and can be operated either via Ethernet, fibre optics or WLAN.
