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Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Production Wafer Level Burn-in
TV19 VersaTile™ probe cards are designed with Celadon’s patented ceramic technology for superior electrical performance, yet is highly modular due to it’s 28mm x 28mm chassis. Micro-adjustments can be made in seconds with an allen wrench and a microscope. Easily align VersaTile cards for different wafer layouts using a 4.5” compatible 1×3 , 200mm, or 300mm VersAdjust plate.
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J-Detect Pro
With J Detect, rest assured about the results. Its highly accurate scanner misses nothing and can also detect if the diamond is enhanced or treated at a budget that doesn’t burn a hole in your pocket.
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Wireless Digital Multimeter 4000 count / NCV / SPT and with Anti Burn Protection
MS-W2034P2
This is a Palm Size external wireless connectivity Digital Multimeter integrated with 4000 Count, True RMS, auto and manual measurement.
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Burn-In Board Tester
Focus-275
Focus275 is a tester for burn-in board.It can improve reliability of burn-in board by inspecting boards for burn-in test by Focus275 regularlyBoth short open test and component test can be done by sending electric signals for special socket contactor and edge part.
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Burn-in System
Sonoma
High power burn-in system with advanced testing functionality at DUT level for substantially lower cost and high performance using State-of-the-Art technology
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Continuity Tester, LED
26330
If the bulb lights up, continuity exists. If the bulb fails to light, the circuit is open. Not for use on live circuits, but incidental contact with 12V supply will not burn out LED bulb.
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Loopbacks
Loopbacck plugs are used for network diagnostics, system configuration testing, and device burn-in. Looping back the signal allows for testing of the optical network.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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Burn-In Test
Trio-Tech provides a comprehensive range of semiconductor testing services through its state-of-the-art laboratories in the Far East. The laboratories provides static and dynamic Burn-in /HTOL /SLT testing and other testing services. All of the company’s testing facilities are ISO9001, ISO14000, ISO17025 and DSCC certified ensuring that operating policies and procedures meet stringent international standards for consistency and reliability.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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LGA Sockets
We’ve taken our QFN expertise and combined it with the versatility and performance of the H-Pin® to leverage an LGA socket platform that serves the demanding requirements of today’s market. Plastronics LGA sockets using the H-Pin provide a high-performance socket that is affordable for all burn-in operations. These LGA sockets meet the power, temperature and signal performance needs of the higher density, larger package outline, and sometimes mix-pitch LGA designs. The LGA platform serves package sizes from as small as 2.0mm X 2.0mm to the industry’s largest standard socket for 60.0mm X 60.0mm packages.
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Analog Multimeters -VOM
Triplett Test Equipment & Tools
Analog Multimeter is a multi-range instrument for electrical and electronic troubleshooting and measurement. It can stand up under rigorous hard usage of the industrial and maintenance environment. Using a unique design and selection of materials, it can withstand the normal accidents of dropping (up to 5 ft.) and rough handling which occur in hard day to day use. Engineered for significant reduction in the need for maintenance by virtual elimination of parts burn out (other than fuses), and parts damage from severe mechanical abuse.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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DC Electronic Loads
Electronic Test & Power Systems
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.
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Multi-Stage Injection Measurement System
Common rail fuel injection system in diesel engines is a fuel injection system which improves output performance and fuel consumption by purifying exhaust gas (soot, NOX) and reducing noise and vibration.The fuel is completely burned by being sprayed in the form of mist which burns easily at high pressure, and furthermore the combustion timing is optimized with electronic control.In this common rail injection system, injection timing by an electric controlling has great effect on the performance of an engine. So measurement of injection amount, injection rate, and injection timing are very important. FJ-8000 series Multi-Stage Injection Analyzer is able to measure those parameters for every 1 cycle by simulating in the environment which is near to an actual vehicle running.
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Advanced Burn-in and Test System for packaged parts
ABTS-Li
High power logic individual temperature control
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Burn-in Systems
Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
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RF Bias Burn-In System
These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.
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Custom PCB Test Fixtures
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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Thermal Protective Performance Tester (TPP)
Sataton Instruments Technology CO., Ltd
Thermal protective performance tester (TPP) is to determine the heat transmission of protective clothing or textiles exposed to flame and radiant heat resources. The tester which can provide thermal protection index (TPI) calculated by software is the recommended tool for evaluation the potential of second degree burn of the materials to block convective and radiant heat penetration. Analysis software can display real-time temperature curve and automatically detect heat time curve to show Stoll curve for rating the thermal protective performance of tested textiles.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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MFP-570 Main Fuel Pump
The MFP-570 provides main engine burn flow as well as servo flow and engine actuator flow. This two-stage “cartridge type” fuel pump is designed to be inserted directly into the engine fuel metering unit.
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Environmental Test Chamber
High and Low Temperature Test Chambers, ESS Environment Stress Screening, 2 Zone Thermal Shock Test Chamber, 3 Zone Thermal Shock Chambers, Walk-In Chambers, Burn-in Room and Aging Test Chambers, Altitude Chambers, Industrial Drying Oven, Salt Spray Test Chambers, Temperature Humidity Vibration Comprehensive Test Chamber, Test Machine Series, Custom Made Environmental Test Equipment, Double-Layer High and Low Temperature Chamber, Explosion Proof Temperature Chamber For Power Battery, etc.
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6 Chip Detection and Burn Channels
CD1
The CD1 provides 6 Chip Detect and Fuzz Burn interface(s). A Chip Detector (CD) is a magnetic-electrical device that provides a reliable method of detecting impending failure of bearings and gears.
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Electric Burn-in Board Carts
Conforms to SEMI ergonomic standards Holds and transports card cages for semi-automatic loading/unloading. Holds up to 10 burn-in boards. Raises and lowers the burn-in boards for easy loading/unloading of boards into ovens or onto test benches. Cart can be adapted to dock with any Micro Control oven.
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Multiple Channel Burn In Power Supply
MCPS
The most important features of this burn in power supply is its ability to hold a constant output for each channel even in the event that a unit under test on one channel may short and fail. Since each channel has it''s own transformer, no glitches or voltage spikes can get into any of the other channels. This image shows the results as the second channel from the left is shorted with a small wire and the circuit breaker pops out. Used for burn-in testing and other timed testing where power isolation is required. Very basic simple circuit, see schematic below. Cleans and frees up benchtops, burn in racks and work space clutter. Available in benchtop or rackmount.
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Burn-in Board Continuity Tester
CT-1
Burn-in Board Coninuity Tester. Verifies burn-in board continuity and component tolerances. 768 I/O channels, can be forced to the constant current source or grounded independently. Highly accurate measurement of resistance, voltage, and capacitance using a pair of precision instrumentation amplifiers.
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Burn Down Transformer
ATG 6000
BAUR Prüf- und Messtechnik GmbH
Cable fault location with the BAUR ATG 6000. The high performance ATG 6000 burn down transformer is used for impedance reduction of cable faults in low- and medium-voltage networks. The short-circuit proof 5.75 kVA stray field transformer delivers a maximum voltage of 15 kV and is housed in a fully enclosed 19" housing.* Proven methodes for cable faults that are difficult to locate* Useful for cables that are difficult to access* Robust construction for reliable functions* Independent current and voltage control on each burning level
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Multisite Probe Card
T300 ButtonTile™
The Celadon T300™ probe cards are designed for long-term, multi-site, high-density wafer level reliability or burn-in tests up to 400°C. In today’s economic environment, conventional reliability data is needed quickly while eliminating the cost, electrical stress, and delay of parts packaging while maintaining a wafer performance map.
