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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- Taylor Dynamometer, Inc.
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Dynamometer Controls, Data Acquisition Systems and Instrumentation
Whether you want a basic engine dynamometer configuration that provides torque, rpm and power or need an advanced, full-featured test and measurement software package, Taylor has a data acquisition system that will serve your unique application without breaking your budget. Contact Taylor to discuss which instrumentation system and related accessories are right for you, and turn your testing challenges into success.
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Thermal Imaging Sensor
3550 FC
Condition monitoring sensor to visualize thermal patterns on multiple assets. Maintenance managers can now collect a more comprehensive variety of key-indicator data — thermal imaging, voltage, current, temperature, and power — on critical equipment to build a real-time picture of an asset's condition. With the right mix of data all in one place, managers can implement planned maintenance and decrease the frequency of preventive rounds.
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ATOS ScanBox
Series 7
The ATOS ScanBox Series 7 is mainly used in car manufacturing, in try-out toolmaking and in press shops. The optical 3D measuring system performs complete analysis measurements for comparison in the introductory phase or is used for quality control in production. Large parts such as automobile side panels and attached parts of up to 6 m in size can be measured. The full- field measuring data enable the analysis of hole pattern, trimming and character lines. Even heavy and large parts for other applications can be measured and inspected with the ATOS ScanBox Series 7.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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Non-contact Ultra-High Range Sheet Resistance Measurement System
CRN-100
*Ultra-High range sheet resistance measurement for 10E+9 ~ 10E+15 ohm/sq without contacting*Mapping program software;*1. Arranged in a multipoint pattern measurement is programmed*2. 2-D & 3-D mapping software*Easy operation by Windows 7 system software*Measurement data base link with Excel via CSV format file*Unaffected by contact resistance
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PXIe-6536, 32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module
779988-01
32-Channel, 25 MHz, 100 MB/s PXI Digital I/O Module—The PXIe‑6536 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Azure Data Explorer
Azure Data Explorer is a fast, fully managed data analytics service for real-time analysis on large volumes of data streaming from applications, websites, IoT devices, and more. Ask questions and iteratively explore data on the fly to improve products, enhance customer experiences, monitor devices, and boost operations. Quickly identify patterns, anomalies, and trends in your data. Explore new questions and get answers in minutes. Run as many queries as you need, thanks to the optimized cost structure.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Pulse Pattern Generators
PPG
The Pulse Pattern Generator family (PPG), also knows as Serial Data Pattern Generator (SPG), is designed to generate a stream of binary information.
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PCIe Fast Digital Waveform Acquisition/Pattern Generator - 32 Digital I/O Channels, 1 kS/s up to 125 MS/s Sampling Speed
M2P.7515-X4
The M2p.75xx series of fast digital I/O cards allow to acquire or replay digital patterns with a programmable speed of up to 125 MS/s. The direction can be switched by software between input (digital data acquisition) and output (digital pattern generation). The on-board memory of 1 GByte can be completely used for digital pattern. Furthermore the on-board memory can be switched to a FIFO buffer allowing to continuously stream data in either output or input direction.
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Digital Flight Control Computer
The Digital Flight Control Computer is a Quadruple Redundant Flight Control Computer designed by DRDO and ADE and manufactured by Bharat Electronics Limited. Data Patterns has designed and manufactured the Automated Test Equipment required for the validation of this DFCC.
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Electronic Warfare
Data Patterns has developed a line up of State of the Art Integrated solutions for spectrum monitoring, wideband searching, ECM & ESM, direction finding for Airborne and Ground Mobile Applications standard Products include VHF/UHF Search Receiver, HF Search Receiver, Monitoring Receiver & Jammers.
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PAM4 Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
Golight PAM4 BERT integrates a 4-CH or 8-CH multistage pulse pattern generator (PPG) and a highsensitivity error detection (ED) to achieve BER measurement of data transmission in 200Gbps and 400Gbps. PAM4 BERT provide the best solution for automated production testing of 200G and 400G highspeed optical transceiver.
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Compact Anechoic Chambers
If you have mmmwave or THz antenna phased-array that require Over the Air measurements, MilliBox has the equipment and tools that you need. With the help of MilliBox compact anechoic chamber system, you can plot radiation pattern , collect data from those plots, and assess your antenna performance easily and precisely.
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Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
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Acute 48-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3064B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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Pattern Generators
Active Technologies Data Pattern Generators offer a complete and unique portfolio of instruments to address a wide range of applications starting from Digital Logic and Semiconductors characterization, Aerospace & Defense compliance testing, Mixed Signal Systems testing to Signal Integrity experiments.
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2.0 ~ 68.0 Gb/s Pulse Pattern Generator
CA9809
The UC INSTRUEMNTS CA9809 2.0 ~ 68.0 Gb/s Pulse Pattern Generator pulse pattern generator and error detector is a high performance, flexible and costeffective broad band data rate covered Pulse Pattern Generator that can operate from 2.0 Gb/s to 68 Gb/s. The CA9809 can be used with existing equipment to generate higher rate bit streams for use in telecom applications up to 68 Gb/s. Broadband test systems will benefit from the low power dissipation, precision connectors, and excellent output waveform characteristics. The compact size of the equipment allows the CA9809 to be placed at the measurement plane, reducing or eliminating artifacts related to long cables.
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Avionics Suite Tester
Based on order from the Navy, Data Patterns developed the complete Automated Test Equipment required for validating all the Line Replaceable Units (LRUs) utilized in the Seaking Helicopter. The upgrade was carried out at multiple Naval bases in India.
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MMW Field Sensors
ITS-9050
The Innovative Technical Systems ITS-9050 Detector is a sensitive, harmonic mixing detector designed to measure millimeter-wave free-space radiation. It is ideal for measuring radiation patterns of antennas inboth the near and far-field. The ITS-9050 employs a free-running dielectric resonator oscillator (DRO) and an integrated harmonic mixer with a waveguide RF input that either connects directly to a circuit under test or to an antenna for radiation detection. The resulting IF is amplified and detected by an IF log-detector that drives a front panel LCD voltmeter to provide an indication of signal strength. A DC output voltage from the log detector is available on a BNC connector to drive external data acquisition instrumentation. Also, a sample of the IF output is provided for measurement on a spectrum analyzer.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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PXI Digital Pattern Instrument
The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Read-Write Analyzers
Guzik Read/Write Analyzers (RWA) work in conjunction with Spinstands to write data to the disk media and read back the signal for detailed analysis. We have two RWA-4000 series available for For Two Dimensional Magnetic Recording (TDMR) and non-TDMR technologies. The RWA 4000 series offer upto 8Gbit/sec maximum write data rate and 3.5 GHz analog bandwidth for all parametric measurements. Each RWA features a pattern generator with 1psec resolution of bit pre-compensation and supports PRML chip integration. Servo writing and processing is provided for Guzik Spinstand models. Select the pre-amplifier (UP14) as well as a variety of enhancements including programmable filters and PRML chip adapters.
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Data Analytics Platform
CISC provides software modules to collect and analyze data from IoT devices. They can easily be integrated into any existing infrastructure. User-friendly reports and visualizations of the data provide comprehensive insight into what is happening in your business. Furthermore, our platform is able to diagnose and even predict failures as well as discover usage patterns or analyze performance.
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32-CH 80 MB/s High-Speed Digital I/O Card
PCIe-7300A
ADLINK PCIe-7300A is an ultra-high-speed digital I/O card. It consists of 32 digital input/output channels. High performance designs and state-of-the-art technology make this card ideal for a wide range of applications, such as high-speed data transfer, digital pattern generation and digital pattern capture applications, and logic analyzer applications. Trigger signals are available to start the data acquisition of pattern generation.
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Pin-Line™ Collet Socket with Wire Wrap Pins
Series 0503
Pin-Line Collet Sockets with Wire Wrap Pins. Features: Rows of socket strips may be mounted on any centers and are end-to-end or side-by-side stackable for .100 [2.54] grid or matrix patterns. Available with wire wrap or solder tail pins. Consult Data Sheet No. 12013 for solder tail pins. Break feature allows strips to be cut to the number of positions desired.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
