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- Scientific Test, Inc.
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Curve Tracer
CS-3000 Series
CS-3300 / CS-3200 / CS-3100 three model line-up. Maximum peak voltage: 3,000V (high-voltage mode for all models) in CS-3000 Series.Maximum peak current: 1,000A (CS-3300 high-current mode). The CS-3000 Series are CE-marked and UL listed.
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1500V 15A I-V Curve Tracer
I-V500w
I-V500w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V500w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Curve Tracer
CS-5000 Series
Maximum peak voltage: 5,000V (high-voltage mode for all models) in CS-5000 Series. Maximum peak current: 1,000A (CS-5300 high-current mode). The CS-5000 Series achieves 5,000V of max. peak voltage with the same physical size as the CS-3000 Series. Best suited for the measurement of a power devices that have 3.3kV and 4.5kV withstanding voltage.
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Semiconductor Curve Tracer
CS-10000 Series
This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
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Curve Tracer
CS-10000 Series
Hi-voltage devicesDevelopment of new devices (SiC/GaN)Automotive Companies
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I-V Tracers
EKO I-V tracers (MP-160 / MP-11 / MP-180) can be used in three different Power ranges. The research type MP-160 is an all round instrument to be used with single cells and modules or multiple unitswhen connected to the multi channels selectors. The portable MP-11 with remote sensor unit can be used on site to accurately check the performance of Modules and Strings. The high end MP-180 is capable to make high precision I-V measurements of small and large size solar cells and is most suitable for Research and Development applications or production inspection purposes indoors.
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Pulsed IV Systems
AM3200-Series
AMCAD Engineering has created professional, industry-proven pulsing technology for both standalone IV-testing (Pulsed IV, PIV) as well as pulsed-bias load pull (Pulsed Load Pull, PLP) and high-voltage power semiconductor applications. Systems come equipped with a mainframe controller which includes integrated power supplies. Input and output pulser modules (probes, pulsers) are selected for specific applications and are available in bipolar ±25V/1A and high-voltage 250V/30A models.
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1500V 15A I-V Curve Tracer
I-V525w
I-V525w allows field detection of I-V Curve an of the main characteristic parameters both of a single module and of strings of modules for PV installations up to a maximum of 1500V and 10A or 1000V and 15A. For measuring I-V Curve, I-V525w manages an internal database of the modules, which can be updated at any time by the user and comparison between the measured data with the rated values allows immediately evaluating whether the string or the module fulfills the efficiency parameters declared by the manufacturer.
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Pulsed IV
AURIGA 4850
Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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BH Curve Tracer
6700BH Series
This BH curve tracer is adopted pole coil measuring method. The limit of size and shape for measuring work is very little and it can measure the difference of both face and reverse side of magnet.
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IV Tester System
PET-CC
Application ■Mono crystalline silicon (Si) ■Multi crystalline silicon (mc-Si) ■Amorphous silicon (a-Si) ■Gallium arsenide (GaAs) ■Gallium indium arsenide (GaInAs)
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Stand-alone I-V Test Systems
OAI offers a complete line of high performance I -V Testers. I -V Testers and I -V Rider software may be ordered as a stand -alone system or integrated into any OAI Solar Simulator. Three standard ranges of I -V Testers are available; ≤1A, 1 -5A, 5 -10A, and 20A. Higher current testers are available as custom options. An OAI Application Engineer will work with you to insure that the I -V Tester and I -V Rider software you choose is optimized for your specific application.
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Semiconductor Curve Tracer
CS-3000 Series
*Max. Peak Voltage : 3,000V（HV mode）*Max. Peak Current : 1,000A（HC mode）*Equipped all models with LEAKAGE mode (Cursor resolution 1pA）*USB port for display hardcopy, waveform data (CSV format) and measurement setup SAVE/RECALL*LAN interface for Remote Control
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IV Curve Tracer
IVCT
In recent years, we have been developing a sophisticated IV curve tracer for PV modules including a maximum power point tracking (MPPT) function. The IV curve tracer is designed for operation with any market-available steady-state solar simulator. Through our web-based software design, the operator can supervise the test results from every computer in a company network. The software contains functions such as an irradiation sum counter that helps to check requirements stated in a stabilization test like they are defined in IEC 61215 (MQT 19). We have also included a correction function to correct the traced IV curves to standard test conditions (STC) when the user enters the required temperature coefficients. One of the most important features is the multi-IV curve tracing function, which enables the user to display more than 150 IV curves in one graph. This eases the analysis of the weakest cells in hot-spot tests, which are required in IEC 61730 (MST 22) and IEC 61215 (MQT 09).
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Flat Field and Imaging Gratings - Type IV
HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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Quick I/V Measurement Software For PXIe SMU
PX0109A
The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Power Device Analyzer / Curve Tracer
B1505A
The Keysight B1505A Power Device Analyzer / Curve Tracer is the only single box solution available with the capability to characterize high power devices from the sub-picoamp level up to 10 kV and 1500 A. These capabilities allow evaluation of novel new device such as IGBT and materials such as GaN and SiC. The B1505A supports a variety of modules: high voltage SMU (HVSMU), high current SMU (HCSMU), ultra high current (UHC) module, ultra high voltage (UHV) module and high voltage medium current (HVMC) module. The B1505A also supports: high-power SMU (1 A/200 V), medium-power SMU (100 mA/100 V) ,medium-current SMU (1 A/30V pulsed, 100 mA/30V DC) and a multi-frequency capacitance measurement unit (1 kHz 5 MHz). Its ten-slot modular mainframe allows you to configure the B1505A to suit your measurement needs.
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I-V Measurement Systems
The I-V Curve Data Acquisition includes a fixture for holding cells for testing (see Figure 1 below). This fixture can accommodate cells from small to up to 100 mm x 100 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. Two micro-manipulators are provided as shown in Figure 1. Each micro-manipulator has two spring loaded contacts to allow 4-wire measurement even for cells that have top contacts only. Two back-side voltage contacts are embedded in the Plate (galvanically isolated from the Plate) and make good electrical contact when the cell is held down by vacuum to the plate. All voltage and current probes are gold-plated. The cell is held down with vacuum during testing (built-in vacuum pump).
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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Precision Curve Tracer
CurveMasterTM
The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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Precision IV Analyzer / 8 Slot Precision Measurement Mainframe
E5270B
Keysight E5270B Precision IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5270B supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 0.1 fA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU's versatile measurement capabilities and GUI based characterization software makes the E5270B the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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IV Characteristics Measurement Device [
PECK2400-N
Easy-to-use measurement software supports IV measurement (software + source meter + connection cable) ● Compatible with Windows 10 ● RS-232C connection (PC is optional) ● Works with NI GPIB. ● Simultaneous use with IPCE PEC-S20 D type is possible. ● There is only one operation panel. done on one screen.
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IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
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DELTA™ IV 4-zone Flow Ratio Controller
DELTA™ IV 4-zone Flow Ratio Controller is a digital controlled, browser-enabled, process control instrument providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution for semiconductor, flat panel, and solar panel process uniformity and control. It is available in EtherCAT® or DeviceNet™ providing the latest gas flow ratio measurement and control technology to meet the demands of multi-channel flow distribution.
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Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture)
B1505AP
B1505AP provides eight different pre-configured packages that satisfy a wide variety of power device measurement requirements. The package can be selected according to voltage / current range and the requirement for capacitance measurement.
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Solar Cell I-V Characterization System
VS6821
Industrial Vision Technology Pte Ltd.
This system provides cell manufactures and laboratories a new way in testing and measuring photovoltaic cells. Integrated with Steady-State Solar Simulator, it provides complete coverage of testing parameters and measurement requirements by most international standards. Its test methods, procedure & equipment are IEC 60904 compliant. Calibration of reference cell is performed at Fraunhofer ISE in Germany, and is traceable to PTB.
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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CAT IV 600 A TRMS Navigator Clamp Meter
ACD-51NAV
This versatile clamp-on power meter offers a full range of diagnostics, including those that HVAC technicians need most—volts, amps, resistance, capacitance, DC microamps, in-rush current and temperature.
