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- Pickering Interfaces Inc.
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LXI WTB Extender
60-984-001
The 60-894 provides a simple an effective method of joining two LXI WTB bus cables together to extend the length of available cables. It is an ideal solution for cable extension where users need to experiment with different cabling solutions without having to totally replace the cables in the system. The 60-894 provides mating connectors for the WTB on each end connected together by a set of accurate differential transmission lines to avoid additional reflections on the cable. The 60-894 is entirely passive and is compatible with the LXI specification.
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Halogen & Deuterium Halogen Light Sources
Avantes Deuterium light sources are known for their stable output ad are used for UV absorption or reflection measurements. These can also be used as irradiance calibration sources due to their high stability. The standard AvaLight-DH-S mixes the halogen light with the Deuterium light, thus producing a wide spectral range light source. The output spectrum of Deuterium light sources exhibits several peaks, with a prominent peak at 656 nm. The AvaLight-DH-S-BAL incorporates a dichroic beam splitter installed to minimize these peaks, providing a smooth spectrum from 200-2500 nm.
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Launch Fiber Box
OTDR measuring devices are used in various ways in fibre optic technology. They enable extensive characterisation of existing fibre optic cabling networks. The use of launch and receive fibres is advantageous when it comes to ensuring precise results evaluations. With bidirectional backscatter measurements with launch and receive fibres, the attenuation values of the first and last plug-in connection can be determined precisely by averaging and device dead zones can be avoided. Measuring device manufacturers recommend different lengths of launch and receives fibres to avoid “phantom reflections”. These launch and receive fibres are also subject to measuring equipment monitoring and should regularly undergo revision in accordance with the OTDR measuring devices. A good measurement result depends on the state and quality of the measuring equipment used. Diamond offers various types of launch and receive fibres, one with standard telecommunications connectors and the other with an outdoor connector for harsh environments.
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Glass Thickness Meters
Shenzhen Linshang Technology Co., Ltd.
As a supplier of laser glass thickness gauge and glass thickness measuring tool, Linshang provides two models of glass thickness gauge that can be used to measure the thickness of various glasses, i.e: single-layer glass, double glazing, triple glazing, multilayer glass, LOW-E glass, and insulating glass, especially suitable for installed glass, such as doors and windows, curtain wall glass, etc.. It can measure the glass thickness as well as the thickness of air space (between the glass). The glass check works on the basis of reflection in the glass.
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PXI-2559, 2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module
778572-59
2.5 GHz, 75 Ω, Dual-Terminated SPDT PXI RF Relay Module - The PXI‑2559 is a general-purpose switch module featuring two independently terminated single‑pole double‑throw (SPDT) relays. You can use it to add flexibility to your video switch network or to maintain uniform signal paths across multiple channels when building high-channel-count multiplexers. The PXI‑2559 termination resistors minimize reflections on open channels and protect your source or device under test from damage. The module also features excellent insertion loss, voltage standing wave ratio (VSWR), and isolation parameters to minimize signal degradation. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Versatile RF Network Analyzers for LF and MF
TE3000-series
The TE3000-series of RF vector network analyzers have full vector measurement capability, and accurately resolves the resistive, capacitive and inductive components of a load. The user can display the vector impedance plus a range of related parameters including SWR, reflection coefficient, return loss and R-L-C equivalent circuit.
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Total Reflection X-ray Fluorescence (TXRF) Services
A highly surface-sensitive technique, TXRF is optimized for analyzing surface metal contamination on semiconductor wafers.
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TXRF Spectrometers
Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.
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Transmission / Reflection Measurement
Measure spectral transmittance and reflectance of optical elements such as lens, plate glass, filter, reflector, prism and so on.The wavelength range is 350 to 1100 nm as standard and 220 to 2000 nm as an option.Reflection measurement of a general spectrophotometer can only measure several types of fixed angles, but in this device the incident angle of the sample at the time of reflectance measurement is variable at an arbitrary angle and the minimum incident angle at reflectance measurement is 15 ° ( Optical axis angle 30 °) can be set up.
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Calibration Standards
Traceable calibrated reference lamps, detectors and reflectors for the calibration and adjustment of sensors and measurement devices for light, optical radiation and light reflection.
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Gloss Meters
Konica Minolta Sensing Americas, Inc
Gloss meters measure specular reflection or gloss of a surface (Specular reflection describes how a reflective surface such as a mirror reflects light waves from its surface). Specular reflection is directly related to the ratio of incident light (the light that falls on an object) and reflected light (the light that bounces off an object) and is the basis for standardizing and measuring gloss values.
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Noise Source, 10 MHz to 18 GHz, nominal ENR 15 dB
346B
The Keysight 346B noise source is the ideal companion to Keysight's noise figure solutions. Since it is broadband (10 MHz to 18 GHz), it eliminates the necessity for several sources at different frequency bands. The low SWR of the noise source reduces a major source of measurement uncertainty; reflections of test signals. The 346B's high ENR, low SWR, and variety of connectors make it a general-purpose noise source. Add special option H01 for high ENR (21 dB typical) to measure high noise figure devices, or option H42 for measuring Direct Broadcast Satellite (DBS) low noise block converters.
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Light Sources
For applications such as transmission, absorption, and reflection, illumination sources are needed. Avantes offers a wide range of different types of light sources, to suit your specific application needs. An overview of the different types of light sources can be found below.
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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1310/1550 nm Dual Laser Source Back Reflectiom/Power Meter
GM8019 + GM83001E
The UC INSTRUMENTS GM8019 + GM83001E 1310/1550 nm dual laser source back reflection meter and power meter is a compact, direct display instrument for the convinent measurement of backreflection, insertion loss and power connector, fiber optic components, and system. With a single output port, the meter is very easy to use and ideal for fiber cable jumper manufacturers.
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Predicting Microwave and RF Designs Virtually
RF Module
The RF Module is used by designers of RF and microwave devices to design antennas, waveguides, filters, circuits, cavities, and metamaterials. By quickly and accurately simulating electromagnetic wave propagation and resonant behavior, engineers are able to compute electromagnetic field distributions, transmission, reflection, impedance, Q-factors, S-parameters, and power dissipation. Simulation offers you the benefits of lower cost combined with the ability to evaluate and predict physical effects that are not directly measurable in experiments.
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Optical microscopy (OM)
Materials Analysis Technology Inc.
Optical microscopy is used to display the surface morphology of samples by 2D intensity contrast due to deflection and reflection of visible light shined on areas of interest. Its resolution is about half of the incident wavelength, which is ~0.2 μm for visible light (wavelength of 400-700 nm). Such resolution limits the maximum magnification to X1000, and thus optical microscopy provides preliminary inspection of sample surface structure.
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X-Ray Components
Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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SparkFun Distance Sensor
1.3 Meter, VL53L4CD (Qwiic)
This SparkFun Distance Sensor Breakout utilizes the VL53L4CD next generation ToF (Time of Flight) sensor module to give you the highly accurate measurements at short ranges for its size. The VL53L4CD from STMicroelectronics uses a VCSEL (Vertical Cavity Surface Emitting Laser) to emit an infrared laser to time the reflection to the target. That means that you will be able to measure the distance to an object from 1mm to 1300mm away with millimeter resolution! To make it even easier to get your readings, all communication is enacted exclusively via I2C, utilizing our handy Qwiic system so no soldering is required to connect it to the rest of your system. However, we still have broken out 0.1”-spaced pins in case you prefer to use a breadboard.
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Network Analyzers
A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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120 A High Voltage 50 Ω Pulse Generator
TLP-12010C
High Power Pulse Instruments GmbH
- High pulse output current up to 120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical rise time 100 ps (0 A to 40 A) and 300 ps in high-current mode (0 A to 120 A)- Wafer, package and system level TLP, VF-TLP and HMM testing- Up to 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 USB programmable pulse rise times: 100 ps to 50 ns (custom selectable)- 8 (optional 9) programmable pulse widths: 0.5 ns (optional), 1 ns to 100 ns (0 A to 40 A), 1 built-in pulse width: 100 ns (>40 A)- The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0 A to 40 A)- Optional external pulse width extensions from 5 ns to 500 ns (>40 A to 120 A)using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient sofware for system control and waveform data management- The sofware can control automatic probers for fast measurements of complete wafers- Combines TLP-12010A and TLP-4010C into one system- Can be operated together with TLP-12012A6 and TLP-3011C pulse width extenders- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface
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Wall Measurement Thickness Gauge Wall Thickness Test Instrument
HS160
Shenzhen Chuangxin Instruments Co., Ltd.
HS160 Wall measurement thickness gauge, wall thickness measuring equipment apply to measure the thickness of all kinds of material, through which the ultrasonic wave can propagate at a constant speed and can get reflection from the back. This instrument can be used for a variety of plate and all kinds of machining parts for accurate measurement. Another important function of this gauge is to monitor all kinds of pipelines and pressure vessels used in the production equipment, monitoring their degree of corroded thinning during the using process. It's widely used in petroleum, chemical industry, metallurgy, shipbuilding, aviation, aerospace and other fields.
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PXI-2597, 26.5 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module
778572-97
26.5 GHz, 50 Ω, 6x1 (SP6T) Terminated PXI RF Multiplexer Switch Module—The PXI‑2597 is ideal for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. The internal termination of the PXI‑2597 helps prevent high-power reflections that arise from open channels on the module. You can use the PXI‑2597 onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Retroreflectometer
RMS 1200
Instrument Systems Optische Messtechnik GmbH
The RMS 1200 from the Optronik line from Instrument Systems measures the back reflection of retroreflectors of all kinds in the automotive field and other retroreflecting materials. High-precision measurements are made in accordance with CIE Publication 54.2-2001 and reliably fulfil all current requirements, e.g. ECE R3, SAE J594, ISO-EN-DIN 20471 or DIN 67520.
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Coaxial Short
85140B
The Keysight 85140B coaxial short is used for establishing measurement planes for known reflection phase and magnitude in 50-ohm coaxial systems. It has a 2.4 mm female connector.
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Polarization Scrambler
PS3300
FIBERPRO’s Polarization Scrambler Modules perform polarization scrambling at high speed and make Degree Of Polarization (DOP) zero on time average. It is based on all fiber technology that has enabled us to build practically zero insertion loss, back reflection free and a compact size. Recently it can be applied for PMD mitigation with very upgrade scrambling speed. With high reliable performance this product has been adapted for long-haul application, component measurement test system, sensor , etc.
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Acoustic Noise Generator
ANG-2200
The ANG-2200 Acoustic Noise Generator creates a perimeter of noise that defeats acoustic leakage eavesdropping devices including wired microphones inside walls, contact microphones, audio transmitters located in AC outlets, and laser/microwave reflections from windows.
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RF Bridge, 75 Ohm, 300 kHz to 3 GHz
86207A
The Keysight 86207A high directivity 75 ohm RF bridge offers unparalleled performance in a variety of general-purpose applications. It is ideal for accurate reflection measurements and signal leveling applications.
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High Voltage 50 Ω Pulse Generator
TLP-8010C
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Combines TLP-8010A and TLP-4010C into one system*Can be operated together with TLP-8012A5 and TLP-3011C pulse width extenders*Ultra fast 50 Ω high voltage pulse output with typical rise time 100 ps (0-40 A) and 300 ps (> 40 A)*Up to 80 kW peak output power into 50 Ω load*Built-in HMM pulse up to ±15 kV with 50 Ω configuration*High pulse output current up to ±80 A (short circuit) with minimum 6 dB reflection suppression*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 GPIB programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns (0-40 A), 1 built-in pulse width: 100 ns (> 40 A)*The optional pulse width extender TLP-3011C enables pulse width up to 1.6 µs in 68 GPIB programmable steps (0-40 A)*Optional external pulse width extensions from 5 ns to 500 ns (> 40…80 A) using the external pulse width extender TLP-8012A5*Built-in pulse reflection suppression*Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurements of complete wafers*High performance and high quality components
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Microwave Training Kits
Microwave radiations are mono-chromatic, Plane Polarised and Coherent and they behave like waves. Many laboratory experiments in optics can be performed easily with simple microwave equipments, Reflection, Refraction and polarization including to prove Bragg''s Law can be performed with this microwave Diffraction Spectrometer.
