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Thin Film
layer of material ranging < a nanometer to > a micrometer in thickness.
See Also: Film, Ellipsometers
- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Instrumented Indentation Tester
With Anton Paar’s versatile indentation testers you can precisely determine the mechanical properties of thin films, coatings, or substrates such as hardness and elastic modulus. The instruments handle almost any type of material, whether soft, hard, brittle, or ductile. You can also conduct creep, fatigue, and stress-strain studies on surfaces in the nanometer range.
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Micro-spot Spectroscopic Reflectometry
FilmTek 2000M
Scientific Computing International
Micro-spot size benchtop metrology system engineered for unparalleled versatility and high performance, meeting the needs of patterned film applications requiring a very small spot size. Allows for measurement spot sizes as small as 2µm, and delivers reliable measurement of both thin and thick films.
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Thin Film Thickness Automated Optical Metrology System
7505-K007
The Chroma 7505-K007 Thin Film Thickness Automated Optical Metrology System equipped with 3D sensor is suitable for Roll to Roll processing and thin film thickness measurement. The stage embedded with vacuum adsorption function, making soft UUT a flat surface.
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AI ANALYZER
Nanotronics uses artificial intelligence to give our customers’ unprecedented freedom and control for defect detection. We offer an AI based Anomaly Detection Algorithm (ADA) toolkit that automates the work of writing computer vision algorithms to detect and classify defects on bare substrate and epi wafers as well as on thin films, glass and any other material with a uniform background.
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C-Band / L-Band MWDM
WD1615/C, WD1516/L
Hangzhou Huatai Optic Tech. Co., Ltd.
WD1615/C, WD1516/L WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to EDFA and DWDM network to achieve the combination and separation of C-Band and L-Band.
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Microwave Dielectric Measurement Systems
This system enables fast and non-destructive measurements of materials having various shapes, including thin films. Enables fast and non-destructive measurement of permittivity of thin-films and various dielectric materials using the evanescent mode of an open coaxial resonator.
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Portable Detectors
Portable holiday detectors are designed for various pipeline, plant, and other surface applications where the inspection surface remains stationary and the detector is moved over the inspection surface. High voltage detectors are used for thicker surface coatings, such as those used on pipelines and other industrial applications. low voltage, wet sponge detectors are used for thin film applications.
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Glow Discharge Optical Emission Spectrometer
GD-Profiler 2™
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin and thick films characterization and process studies.
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Audio Line Drivers and Receivers
Analog Devices audio line driver and receiver solutions feature differential-output buffer amplifiers and differential input buffer amplifiers to support a wide range of applications. By using low noise thermally matched thin film resistors and high slew rate amplifiers, these parts maintain the sonic quality of audio systems by eliminating power line hum, RF interference, voltage drops, and other externally generated noise commonly encountered with long audio cable runs. Applications involving this product portfolio include ADC drivers, high performance audio, sine/cosine encoders, and other professional and consumer uses.
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Compact Passive and Active Resistor Trimming for Thick and Thin Film
LRT 2000C
*Travel: 6" x 6"*Laser : Fiber Laser Ytterbium 1064 nm*Kerf: 30 to 80 micron Adjustable*Pulse width : 80 nano second*Rap Rate: 1 to 1 million Pulse Per Second*Average Power: 20 watts
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Film Permeability Tester
Film Permeability Tester is designed to test the permeability of a wide range of packaging materials such as plastic film, composite film, aluminum foil, thin sheets, rubber, porcelain, medical patch, etc.
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Hybrid Amplifiers
Limiting
Macom Technology Solutions Holdings Inc.
MACOM offers a complete line of RF and microwave limiting amplifiers. Our limiting amplifiers use the latest thin film hybrid manufacturing techniques to obtain the highest level of performance, repeatability, and reliability. MACOMs portfolio of amplifiers range from 10 MHz to 4 GHz and are ideally suited for hi-reliability and mission critical applications.
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Ozonated Water Delivery System
LIQUOZON® DI-O3
MKS' LIQUOZON® DI-O3 is a dissolved ozone gas delivery system providing high purity ozone in ultrapure water for Semiconductor and Electronic Thin Film applications like contaminant removal and surface conditioning via wet clean or rinsing methods. The high redox potential of ozone causes rapid conversion back to oxygen making it an environmentally friendly alternative to other chemical processes.
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Scatterometers / Thin Film Metrology Systems
OptiPrime Series
The n&k OptiPrime series are automated metrology systems used to fully characterize and monitor Thin Film and OCD applications for both current and next generation IC processes.
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Low Noise Amplifiers
RPG Low Noise Amplifiers are developed and manufactured using the most modern discrete components and thin film technologies, in order to cover the frequency range 50 to 350 GHz. With improved DC-supply and modern semiconductors these amplifiers not only deliver low noise performance but also broad operating bandwidth and gain flatness. These low-noise amplifiers are available as a standard product and on request as customized manufactured product.
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Spectrophotometers
The PHOTON RT UV-VIS-MWIR research spectrophotometers from EssentOptics are convenient and reliable instruments for a broad range of optical measurement applications. You''''ll always enjoy working with them, trusting their functionality and accuracy.The PHOTON RT UV-VIS-MWIR Universal Scanning Spectrophotometers is a powerful multi-purpose instruments designed for coaters. It offeres incomparably greater advantages when compared with the traditional tools offering unattended measurement of optical thin film coatings including variable angle and polarization-dependent measurements without any attachements.
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Powerful and Cost Effective Spectroscopic Ellipsometer
Smart SE
The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements. It characterizes thin film thickness from a few Angstroms to 20µm, optical constants (n,k), and thin film structure properties (such as roughness, optical graded and anisotropic layers, etc).The spectral range from 450 to 1000nm is measured in a few seconds and ellipsometric data are analyzed using the DeltaPsi2 software platform. The software integrates two levels of software to fulfil both routine analysis with predefined recipes and advanced analysis with state-of-the art ellipsometric modelling.
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80-CH 50G Athermal AWG
Athermal AWG(AAWG) have equivalent performance to standard Thermal AWG(TAWG) but require no electrical power for stabilization. They can be used as direct replacements for Thin Film Filters(Filter type DWDM module) for cases where no power is available, also suitable for outdoor applications over -30 to +70 degree in access networks. Flyin’s Athermal AWG(AAWG) provide excellent optical performance, high reliability, ease of fiber handling and power saving solution in a compact package. Different input and output fibers, such as SM fibers, MM fibers and PM fiber can be selected to meet different applications. We can just offer 19” 1U rackmount package for 50G AWG products.
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Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Thin Film Analyser
TFA
The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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100GHz/200GHz DWDM Module in LGX Box
Flyin Optronics’ 100GHz/200 GHz dense wavelength division multiplexer (DWDM module) utilizes thin film coating technology and proprietary design of non-flux metal bonding micro optics packaging to achieve optical add and drop at the ITU wavelengths. It provides ITU channel center wavelength, low insertion loss, high channel isolation, wide pass band, low temperature sensitivity and epoxy free optical path . It can be used for wavelength add/drop in telecommunication network system.
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Thin Film Chip Resistors, High Stability and Reliability Type
ERA-XV/ERA-XK Series
Panasonic Industrial Devices Sales Company of America
Anti-Sulfurated Thin Film Chip Resistors From Panasonic For Dependable, Accurate And Reliable Performance In Extremely Hazardous EnvironmentsPanasonic's ERA-xV and ERA-xK Series Thin Film Chip Resistors feature a soft terminal and passivated layer. With a total of 2,889 part number variants, Panasonic ERA-xV and ERA-xK Series Resistors provide design engineers with a wide array of Resistors to choose from specifically developed to handle extremely hazardous and challenging application environments.
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Bending Tester
BXW-16
Shanghai Dean Electrical Co., Ltd
Executive standard: GB/T4074.3-2008/IEC60851-3;Applicable to bending test for various electromagnetic wires such as enameled flat wires, paper covered flat wires, glass fiber covered flat wires and thin film covered wires with narrow side less or equivalent to 16mm and corresponding copper and aluminum flat wires.
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Metrology Solutions for Semiconductors
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition.
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Coating Thickness Gauge - Integral
Elcometer 456
Whether you are measuring on smooth, rough, thin or curved surfaces, the Elcometer 456 Dry Film Thickness Gauge produces accurate, temperature stable measurements thanks to its ±1% thickness measurement capability and increased reading resolution.
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Filters / Splitters / Detectors
DiCon’s 100 GHz WDM is designed to multiplex and demultiplex signals in multi-wavelength systems based on the ITU 100 GHz grid. The component uses a thin film filter mounted between a pair of GRIN lens collimators. The 100 GHz WDM is housed in a compact, environmentally stable package that offers superior resistance to humidity and temperature and is suitable for mounting on a printed circuit board or within a module.
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Chip Resistors
Panasonic Industrial Devices Sales Company of America
Panasonic offers a wide range of Chip Resistors including conventional Thick Film Chip Resistors, Specialized Resistors such as Thin Film, Current Sense, Anti-Sulfur, Anti-Surge and Metal Film Chip Resistors.Panasonic’s standard Thick Film Chip Resistors are offered in cases sizes from 01005 to 2512.
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RFoG 4-Band Multiplexer. 1550, 1610 & 1310/1490nm MWDM
WD5643
Hangzhou Huatai Optic Tech. Co., Ltd.
WD5643 WDM is based on mature thin film filtering tech, with wide bandwidth, flatness, low insertion loss and high isolation. It is mainly applied to FTTx PON network to achieve the combination and separation of the 1550nm (CATV) and 1310/1490nm (data).
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Trace Moisture Analyzer
Model 8800P
Teledyne Analytical Instruments
The 8800 series uses field proven aluminum oxide (Al2O3) sensing technology to accurately detect trace moisture on either a continuous or spot checking basis. All Al2O3 sensors share the same basic operating principle: the capacitance measured between the sensor’s aluminum core and gold film deposited on the oxide layer varies with the water content. The 8800 series moisture sensor employs unique Hyper Thin Film (HTF) technology, which offers three major structural improvements in Al2O3 sensor design. These structural changes, noted below, provide the user with increased sensitivity, greater stability and a quicker response time when compared to other conventional aluminum oxide sensors on the market today.
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Reflectance Standards
STAN Series
Ocean Optics offers specular reflectance standards for measuring shiny surfaces such as machined metals and semiconductor materials and low-reflectivity surfaces such as anti-reflective coatings and thin film coatings. The STAN-SSH varies in reflectivity from 87%-98% over the 200-2500 nm wavelength range and is available in a version (STAN-SSH-NIST) calibrated to a NIST master standard. The NIST calibration data range is 250-2500 nm.
