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Ramp Test Sets
airborne avionic and communication test equipment used on the tarmac.
See Also: Flightline, NAV/COMM
- InterWorking Labs, Inc.
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UDP Test Suite
The UDP Test Suite is used by design engineers, quality assurance engineers and testers to find and fix bugs in their UDP implementation. The tests help ensure that the UDP implementation is sufficiently robust so that it is not vulnerable to the wide range of attacks in today's Internet. The tests make use of the Maxwell Pro network emulation environment, so that each test sequence can intelligently impair all aspects of the UDP protocol.
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RAMP TEST SET
AN/USM
Tel-Instrument Electronics Corp.
The AN/USM-708 Multi-Function Test Set provides unsurpassed reliability and ruggedness designed by an established and well recognized company with 50 years in the design and manufacture of aviation ground support and bench test equipment.
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High Voltage, Continuity & Hipot, Cable & Wire Harness Test Systems
CableEye HVX, HVX-21
CAMI Research Inc. (CableEye®)
Fast ● Simple ● Precise
Advanced wiring analyzer scans for continuity (opens, shorts), miswires, resistance, capacitance, components (resistors, diodes, LEDs, capacitors) dielectric breakdown, insulation resistance, intermittent connections
HVX (Item 829) 1500 Vdc, 1000 Vac
HVX-21 (Item 829A) 2100 Vdc, 1200 Vac
For diagnostic and Pass/Fail Testing — Permits expanded testing (compared to models in our low voltage product line) for insulation resistance (IRI) and dielectric breakdown (DWV).
All CableEye testers are suitable for production, fault diagnosis, QC (Quality Control), assembly, and prototyping of standard or custom cables. Each combines test, fault location, design, documentation, labeling, and database storage in one instrument. Tests can be performed on long cables (with or without connectors) or no cables (e.g. connectors, backplanes, PCBs, components).
Standard Features & Benefits:- USB certified, PC-based tester for a versatile, fast, robust system with long life-cycle.
- Multilingual, dynamic, graphic-rich display (netlist & wiring schematic) provides clarity and speeds diagnostics.
- 128 Test Points, expandable to 1024 providing flexibility as your product line changes.
- User-selectable voltage to each connection group in the cable simplifies an otherwise complex process, accelerating testing.
- Programmable Ramp Up, Ramp Down, Dwell Time (same as Test Time), Trip Current, and Trip Delay (same as Soak Time) adds versatility.
- Current leakage detected during HV test phase provides a measure of insulation resistance up to 1 GΩ (HVX) and 5 GΩ (HVX-21) - any leakage current exceeding a preset limit reveals the presence of moisture, flux, or other contamination on exposed contacts.
- Real-time screening for intermittent connections for pinpointing elusive faults and improving quality.
- Automation scripting in a simple, intuitive language allowing non-programmers to reduce operator error by automating repetitive steps.
- Pop-Up Work Instructions. choose the exact amount of detail, imagery, language and automation you need to ensure your work instructions and tests are carried out flawlessly.
- Flexible tolerancing: optionally define as percentages or absolute terms, as well as asymmetrically (e.g. +0%/-10%) for improved yields.
- Barcode-tracking & archival data-logging to achieve error-proof test process and improved traceability & productivity.
- Print PASS/FAIL labels, test reports (with or without color wiring schematics/netlists) and log reports to satisfy ISO9000 reporting requirements.
- Compatible with laptop and touchscreen PCs for fieldwork and rack/off-bench mounting.
Includes:
CB29 board set (Item 759) for bare wire connections; comprehensive PC software with Database of >200 standard cables; 2 yr Product Support Subscription comprising Warranty, free tech support, and free software upgrades.
Select Add-On Options:
Hardware: 128-point Expansion Modules (attach to base); 4-Wire Kelvin Resistance Measurement, 1 mΩ at 1 A; Advanced Measurements; External Measurement Instrument Port (e.g. 10 GΩ Isolation at 100 V); Remote Control Connector for Deadman Switch; Environmental Sensor
Software: PinMap™ fixture editor, Connector Designer™ connector editor, or Autobuild™ guided assembly modules
camiresearch.com |@CAMI_CableEye |+1.978.266.2655 -
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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Capacitance & Tan Delta Testers / Tan Delta Tester
CDF 6000
UDEYRAJ ELECTRICALS PRIVATE LIMITED
CDF-6000 is fully automatic: It automatically ramps up to set test voltage, makes measurement, ramps down test voltage to zero and prints out test results.
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X-Series Measurement Applications for EXM and EXF
Easily achieve your tough manufacturing goals and meet tighter schedules for today's multi-format devices and femtocells using X-Series measurement applications for the EXM and EXF wireless test set. These standards-compliant, technology-specific cellular and wireless connectivity measurement applications help you quickly ramp up production, and optimize full-volume manufacturing. With X-Series measurement applications and the EXM and EXF you can solve today and evolve tomorrow.
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Portable AC Chassis Dynamometer
TD-24-AC-T
The TD-24-AC-T is a self-contained, portable, motorized, Chassis Dynamometer specifically designed for testing Over-the-Highway (OTH) trucks. Rated to test at altitudes up to 10,000 ft (3,048 m), the TD-24-AC-T is road-legal and offers side loading with ramps. The Portable AC Chassis Dynamometer takes less than 60 minutes to set up and begin testing.
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NAV COMM ELT SELCAL TEST SET
TR-36
Tel-Instrument Electronics Corp.
The TR-36 NAV/COMM/ELT/EPIRB Test Set is Tel-Instrument Electronics Corp. latest offering. Updated to the latest in hardware and software the TR-36 can easily provide comprehensive ramp testing in an user-friendly, light weight high-precision instrument for rapid functional testing of VOR, LOC/GS, MB, and VHF COMM (AM/FM), ELT and EPIRB avionic equipment all in a weather proof package with color display.
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RAMP TEST SET
AN/USM-719
Tel-Instrument Electronics Corp.
Based on entirely new up-to-date technology and digital architecture; the AN/USM-719 large 4.75" x 3.5" in. color LCD screen and surrounding soft-keys and keyboard provides easy and quick access to a multiple of test screens menus, and display options affording single man operation, instant results, and a host of pre-programmed and manually variable parameters to meet the most demanding requirement's for testing of advabced airborne avionic and transponder/interrogator systems.
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Environmental Control System Test Platform
The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.
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FPD Tester Model
27014
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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Universal In-Line Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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PXIe Optical Test Modules
Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Regenerative Battery Pack Test System
17020
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Benchtop Communication Test System
ATS3000A
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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In-Circuit Tester
Sparrow MTS 30
The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
