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Near-Field
1) EMF closest to the antenna. 2) Near-field optics.
- LBA Group, Inc
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RF Safety Monitoring
FieldSENSE 60
The fieldSENSE 60 personal RF monitor has a proven track record of durability that works as hard as you do. fieldSENSE 60 is specifically designed with the RF climber in mind. Whether working in the nearfield of a broadcast system or in the far-field of a 5G system, exposure is correctly assessed and a warning is sounded, should the levels approach and exceed the OET65 and Safety Code 6 occupational limits. To ensure the device cannot be dropped off site, connect he device can be attached the included special harness-attachment mechanism. In the event of a warning while the monitor has fallen the buzzer is still within hearing range.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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IGNITION COIL TESTER - ORANGE
MD76500M
*Non-intrusive, quick check tool instantly verifies active or inactive coil operation*Detects the magnetic field created by a coil energizing*Tool can be used to test coil on plug, coil near plug and coil pack systems
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials. The fixture is a section of coaxial transmission line broken to allow the insertion of planar test materials. Although ASTM D4935-10 is currently limited to an upper frequency of 1.5 GHz, the EM-2108 meets and complies fully with both the impedance and SE requirements called out in ASTM test method D4935-10 up to 10 GHz. These results are shown in Figures 1 & 2. The measured data relates to the shielding effectiveness due to a plane wave (far field EM wave) from which near field values for magnetic and electric fields may be inferred.
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Antennas
Our broad portfolio of antennas includes products designed for cellular, broadcast, navigation, RFID, IoT, DAS, mmWave, and more. Our antennas are available in standard and custom designs and engineered for use in cars, heavy-transport vehicles including rail, and a wide variety of personal electronics, including mobile device and wearable technology. Our antennas offer high-quality transmission for a wide variety of frequencies including, but not limited to Bluetooth, WLAN, and ZigBee. We manufacture our antennas in facilities worldwide, which include testing capabilities in near and far field patterns, scattering parameters, SAR, vibration, humidity, temperature shock, salt fog, throughput, and acoustic. We also manufacture antenna assemblies.
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Near Field Probes 30 MHz up to 3 GHz
RF6 set
The RF6 near field probe set consists of 2 passive magnetic field probes and 2 passive E field probes for measurements in the development phase of the E-field and magnetic field in the range from 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF6 set allow a step by step localization of interference sources of the RF magnetic field and RF-E-field on an assembly. From a larger distance the electromagnetic interference is detected by RF-R 50-1 for the magnetic field and by RF-E 02 for the E-field. The RF-B 3-2 and RF-E 10 probes with their higher resolution can more presicely detect the interference sources of the magnetic field and the E-field. Field orientation and field distribution on an electronic assembly can be detected by special guidiance of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
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NIRONE Sensor S
The NIRONE Sensor S brings material measurements from the laboratory to the field: it is small, mobile, innovative, robust and cost-effective. It is enabling fast and reliable measurements at the near infrared (NIR) spectral range from 1350 to 2450 nm and works even in the most demanding environments. NIRONE Sensor S offers excellent performance fully comparable to the best laboratory instruments in a small package and only a fraction of the cost. It can create new applications for materials analysis by NIR spectroscopy, including
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Camera Module Tester
Evolusys Technologies Sdn. Bhd.
• Lens Focusing plus Far Field Sharpness Testing - CTF/MTF/SFR• Near Field Sharpness Testing - CTF/MTF/SFR• Flat Field Grey Image Testing - Optical center, Defect pixels, particles, blemish, shading, color shading, color ratio, SNR, etc.• Dark Field Image Testing - Hot pixels, dynamic range, SNR, etc.• Current Measurement - Active, standby
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1050 MHz Tracing Signal Generator
SM-5011
is used for the early test in the development of electrical products, troubleshooting of CATV/MATV system as well as the test and trouble diagnosis of cellular phone system. Combined with the near field probes of Mz530, it can detect the missing fields of radio frequency
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Cylinder type, Near field Antenna Measurement System
anm02
As it combines the vertical direction of the probe antenna with the turn of the object antenna, and performs the near field measurement in the shape of a cylinder. The result will be converted to far field. Feature The pattern behind the antenna can be measured by a cylinder scanning. Fast measurement.For example ) Vertical direction 256 point and Rotatory direction 180 point : 30 minutes.
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Versatile AFM Optical Coupling
TRIOS
The TRIOS platform is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. TRIOS is the most versatile optical coupling platform providing three ports for optical spectroscopy measurements with top-down, side (oblique) and inverted accesses to the AFM tip and sample.If you work with opaque and/or transparent samples, either in air or in liquid looking at nanoscale structures and near-field optical properties investigation, the TRIOS platform is the right solution for you. It perfectly combines upright optical, inverted optical, and atomic force microscopies, and unleash all the power of both techniques providing instrument adjustment and measurement automation, high resolution and integration flexibility. Such performance is only available from HORIBA.
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Near Field Probes
MFA Family
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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EMC Accessories
Complete your EMC test setup with the essential accessories to compliment the test equipment. Whether it is a LISN (or V-Network) to counteract interference from external power sources on conducted emissions from the device under test, probes to locate the near field sources of radiated emissions, receive and transmit antennas, or tripods for holding antennas in place, the Rohde & Schwarz catalog of EMC accessories provides the additional items you need for EMI and EMS measurements, guaranteed 100% suitable for use with Rohde & Schwarz EMC test equipment.
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AMIDA VCSEL Tester
AMIDA VCSEL tester can be divided into three parts: LIV measurement system, Near Field measurement system and Far Field measurement system. To achieve the above three measurements, in addition to the necessary optical components and optical instruments, the core technology is to provide fast and stable current pulses to drive the VCSEL laser diode to emit light, and then to test various optical and electrical properties
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Hearing Aid Compatibility Automated Test System
MiNi-HAC
Hearing Aid Compatibility (HAC) evaluation of wireless handsets ensures accessibility of these technologies to the hearing impaired. The MiNi-HAC system can be used for the design and development of wireless handsets as well as for evaluation of hearing aids used by the hearing impaired to gain access to mobile wireless technologies. RF Emissions Test - near field measurements of the electric and magnetic fields emitted by a wireless device.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Controller System for 2 to 96 (128 Optional) Marine Seismic Sources
BigShot
Teledyne Marine Real Time Systems
The BigShot controller system will synchronize 2 to 96 (128 optional) marine seismic sources, with 0.1 msec resolution. It features automatic Continuity/Leakage testing of Solenoid/Sensor lines, as well as monitoring of source Depth and string Pressure. The BigShot also monitors Manifold Pressure over 2 channels, offers Summed Sensor Timebreak detection, and allows configuration for Hydrophone, Shuttle, or PCB sensors. BigShot can handle Near Field hydrophone acquisition at 1 kHz with 16 bit data. The BigShot can also be run with an optional Windows-based Graphical User Interface software package, and a control PC, and is capable of expanded hydrophone data acquisition with the SmartPhone D system.
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Antenna Test & Measurement Solutions
MVG offers the broadest choice of solutions based on near-field, far-field and compact range measurement techniques for Antenna, EMC, RCS and Radome testing. Our solutions support the measurement needs of the Aerospace & Defense, Telecommunications and Automotive industries, as well as Academic and Research institutes. MVG standard systems are customizable, facilitating selection, allowing for specifications, and guaranteeing an upgrade path for the enhancement of system capabilities. From components and parts to full turn-key solutions, the right combination enables our customers to meet specific measurement needs in a variety of testing configurations.
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Lenses for Long-Wave Infrared (LWIR) Cameras for 8-14 µm
LWIR Zoom Lens Assemblies
Teledyne FLIR custom and off-the-shelf long-wave infrared (LWIR) continuous zoom (CZ) optical assemblies and lenses are for integrators and operators who do not compromise on quality. All lens assemblies have near diffraction limited performance and include advanced features that ensure continuous focus through the zoom. Formerly New England Optical Systems (NEOS) and now part of Teledyne FLIR, the world-class technical services team provides product support and can also develop new or customize existing lens assemblies for a camera, application, and mission. Designed to maximize infrared-camera performance, the LWIR CZ lens assemblies provide the competitive advantages required in the field and marketspace for a wide range of defense, security, and commercial applications.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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Near Field Probes
Used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices.
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Zero Gauss Chamber
ZGC
The model ZGC zero gauss chamber reduces the environmental magnetic field (Earth field) to near zero inside the chamber. Any gaussmeter probe which is less than 9.4 mm or 0.370" diameter can be placed inside. The meter is then "zeroed", which means that it will read zero whenever the probe is subsequently placed in zero field. By using a zero gauss chamber, any offset error is therefore eliminated. The model ZGC is unique in that it contains a degausser (demagnetizer). This is situated between the inner and outer mu-metal shields. When the degauss button is pressed, any accidental magnetization of the chamber, no matter how strong, is erased. Accidental magnetization is a major problem with most zero gauss chambers and it has limited their use. If a magnet comes too close, the chamber will become "permanently" magnetized and will have an internal field that is typically 0.2 to 0.5 gauss. The chamber must then be degaussed because the Earth field is also around 0.5 gauss, so a magnetized zero gauss chamber will not significantly reduce the field.
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3D Micro Coordinate Measurement Machine and Surface Roughness Measurement Device
InfiniteFocusSL
With the InfiniteFocusSL you are able to measure form and roughness of your components with only one system. In addition, color images with high contrast and depth of focus are achieved. The robust frame and the intelligent illumination technology provide fast and high-resolution measurement in the laboratory and a production near environment. The measurement system is particularly attractive due to its cost effectiveness, measurement speed and usability. The long working distance in combination with the above average measurement field allows a wide range of applications. Measurements are achieved within seconds, and features, such as a coaxial laser for quick and easy focusing, enhance its usability.
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Deluxe Near-field Detection Receiver
ANDRE™ Deluxe
The ANDRE is a handheld broadband receiver that detects known, unknown, illegal, disruptive, or interfering transmissions. The ANDRE locates nearby RF, infrared, visible light, carrier current, and other types of transmitters. Quickly and discretely identify threats using the ANDRE Deluxe’s wide range of accessories specifically designed to receive transmissions from 10 kHz up to 12 GHz.
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RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Near Field Probes 30 MHz up to 6 GHz
XF1 set
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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Interference & Compatibility Evaluation System
ICEy
Schmid & Partner Engineering AG
ICEy is the most advanced reactive near-field E/H-field scanning system for the analysis of EM interference and compatibility (EMI/EMC) in highly integrated electronics. ICEy is the only system that provides accurate EM measurements traceable to international calibration standards and also allows independent interlaboratory comparability of EMI/EMC measurement results.
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Near Field Probes
Anteral has extensive background in the design of Near Field Probes (open ended waveguides probes). Our Near Field Probes are currently being used in several laboratories around the world including the ESA's anechoic chamber. Anteral designs Near Field Probes from 10 GHz to 750 GHz covering the sectors requirements. Moreover, our Near Field Probes have a sharped design minimize reflections.
