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Focused Ion Beam
A scanning electron microscope with the electron source replaced by a gallium ion gun. Used for fault analysis and modification of modern microchips and semiconductor devices. (http://www.empa.ch)
See Also: Beam
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Microscopy Software/Hardware
ZEISS Atlas 5
Atlas 5 is your powerful hardware and software package that extends the capacity of your ZEISS scanning electron microscopes (SEM) and ZEISS focused ion beam SEMs (FIB-SEM). Use its efficient navigation and correlation of images from any source, e.g. light- and X-ray microscopes. Take full advantage of high throughput and automated large area imaging. Unique workflows help you to gain a deeper understanding of your sample.
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TEM Lamella Preparation And Volume Imaging Under Cryogenic Conditions
ZEISS Correlative Cryo Workflow
ZEISS Correlative Cryo Workflow connects widefield, laser scanning, and focused ion beam scanning electron microscopy in a seamless and easy-to-use procedure. The solution provides hardware and software optimized for the needs of correlative cryogenic workflows, from localization of fluorescent macromolecules to high-contrast volume imaging and on-grid lamella thinning for cryo electron tomography.
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Focused Ion Beam Scanning Electron Microscopes
FIB-SEMs
Combine imaging and analytical performance of a high resolution field emission scanning electron microscope (FE-SEM) with the processing ability of a next-generation focused ion beam (FIB).
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Trace VOC Analyzer
PTR-TOF 6000 X2
The new PTR-TOF 6000 X2 is our premium PTR-TOF trace VOC analyzer. We conceived a unique system comprising of a novel high-resolution TOF and IONICON’s PTR technology with the new “X2” features, for the ultimate PTR-TOFMS experience. X2 combines the latest generation of performance enhancing tools incl. the ION-BOOSTER funnel as well as the hexapole ION-GUIDE. The ion funnel focuses the ions into the hexapole ion guide which results in nearly lossless transmission of an extremely focused ion beam into the TOF mass spectrometer. This increases the sensitivity dramatically and also improves the instrument’s mass resolving power. Utmost resolution, sensitivity and lowest real-time detection limit are now available in a robust, transportable platform that is smaller and lighter than previous products.
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Ion Beam Sources
Veeco offers the most comprehensive array of ion beam sources for a broad range of applications, including the industry's only Linear gridded sources.
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Ion Chromatography
Eco IC
Discover Eco IC, an ion chromatography system that focuses on the essentials while not compromising on quality, robustness, and reliability. Eco IC has been developed to enable more users to benefit from this technique. Whether you need to perform routine water analysis or you’re looking for an instrument for higher education, Eco IC comes with all the components you need. In addition, you can also save time and reduce work by getting an automated system.
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Ion Blower Guns
For manual cleaning tasks, we combine the advantages of Eltex nozzle technology with the variability of a hand-held air gun. Thus, a wide variety of shapes can be cleaned efficiently. For use in hazardous areas, we offer a special version of the ion blower guns.
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ION 100 Portable Ion Meter
The new addition to the Environmental Express Oakton product line features updates to measuring water quality easier and faster. The larger LCD display is 2.75 in. by 2.0 in. for a better viewing angle, and has indicators for battery life, stability, and calibration. The ION 100 meter measures pH, mV, ion concentration of 16 commonly measured ions, and temperature. The microprocessor-based meter features automatic calibration, automatic temperature compensation, function setup, self-diagnostics, automatic power-off, and low voltage display. The meter uses advanced digital processing technology, intelligently improving the response time and accuracy of your measurements. Easily switch units among pX, mol/L, and mg/L (ppm).
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Beam Diagnostics Systems
Characterize the spatial intensity distribution and size of laser beams, and visualize beam shape, with speed and accuracy.
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Capacitors - Beam Lead
Macom Technology Solutions Holdings Inc.
MACOM’s MMI-9000 and 9100 Series Chip Capacitors feature high stand-off voltage and low dielectric loss leveraging nitride/oxide dielectric layers. Gold bonding surfaces, top and bottom provide ease of bonding and minimum contact resistance. MACOMs beam lead capacitors have high insulation resistance, low dissipation factor, and low temperature coefficient, which are features that produce devices with excellent long-term stability.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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15% Beam Splitter
10725C
The 10725C 15% beam splitter, designed for beam diameters of 9 mm or less, reflects 15% of the total incoming laser beam and transmits 85% straight through. This optic is without housing and requires a user-supplied mount.
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High Power Beam Analysis
The advantages of fiber lasers are their high power, mechanical stability and good beam quality; however beam quality and beam profile has to be periodically checked. In general, there are many difficulties in checking beam quality especially at the focal point, where densities will exceed 50KWatt per square cm. On one hand those energies are capable of melting and destroying most known materials, while on the other hand measuring a focused profile is the most significant measurement.
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Benchtop Ion Meters
Benchtop Ion Meters for Cl (chloride), F (fluoride), Na (sodium), Ca (calcium), Br, (bromide), NH4 (ammonium), NH3 (ammonia), Cn (cyanide), Ag (silver), K (potassium), S (sulphide), Pb (lead), I (iodide), Cu (copper), Cd (cadmium)
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Spectro UV-Vis Dual Beam
UVS-2700
Spectro UV-Vis Split Beam PC is a precise scanning Spectrophotometer with a new design of 8 microprocessor automatic 2 row cell holder that moves noiseless with a special membrane. This Split Beam Spectro has a dual detector and a very accurate system.
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Ion Pumps & Controllers
Agilent Vacuum (formerly Varian) offers a complete portfolio of VacIon ion pumps that provide various pumping speeds (from 0.4 to 1000 L/s). Agilent also supplies smart combinations titanium sublimation pumps (Ion CombiTSP) and Non-Evaporable Getter (Ion CombiNEG) pumps for clean and vibration-free environments.Agilent ion pumps and controllers can be customized in a number of configurations to satisfy your vacuum requirements. They are the best choice for those applications where stable ultrahigh or extreme-high vacuum (UHV or XHV) conditions are essential, such as: laboratories, large research facilities, medical devices, scanning electron microscopes, and surface analysis tools.
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Sealed Beam Bulb Testing System
H710019SSL
EOL test for manufacturing of bulbs with LED for applications requiring to ensure watertightness: vehicles, marine, swimming pools, operating rooms, classified areas (Ex Zone), etc. The test system checks in a short time all the light and electrical characteristics of the bulb. A high precision Micro Leakage Meter also checks that there are no leaks between the environment and the inside of the bulb. The test results are recorded on the PC and can be printed on a quality control label attached to each unit.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3400
UVD-3400 has an excellent performance blazed holographic grating optimized and optional reflectance attachment CT-type Monochromator and reduces stray light and widen the photometric range. Wavelength range: 190 nm – 900 nm ; Spectral bandwidth: 2nm
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Ion & Electron Detection
Photonis is the global leader in the development and manufacturing of detectors and optical components to detect ions and electrons. These detectors and components have been designed for a wide range of scientific instruments used in space and research projects but also in cells and material analysis in lifescience or non destructive testing.
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Beam Lead PIN Diodes
The SemiGen SBL 2000 series Beam Lead PIN Diodes feature fast switching speeds at both low capacitance and resistance. Beam Lead PIN Diodes have high levels of mechanical strength and stability during assembly. These diodes are suitable for microstrip or stripline circuits as well as circuits requiring high isolation from a series of mounted diodes such as multi-throw switches, phase shifters, attenuators and modulators.
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Laser Beam Analyzer System
The Haas Laser Technologies Laser Beam Analyzer System is a modular design. The system includes software, sensors, attenuation modules and filters which enable “real-time” laser beam measurement, analysis and monitoring of high power CW and pulsed lasers.
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Ion Blower Nozzles
VARIO discharge products consist of a separate AC power supply unit for connecting one or more Eltex discharging components. In SINGLE discharging, the voltage generation (power supply unit) is integrated in the bar.
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UV-Vis Double Beam Research Spectrophotometer
UVD-3500
The high- performance blazed holographic grating and the optimized CT-type Monochromator reduce stray light, and widen the photometric range. Wavelength range: 190 nm – 900 nm. Spectral bandwidth: 0.1, 0.2, 0.5nm, 1.0nm, 2.0nm, and 5.0 nm.(UVD-3500).
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Headlight Beam Testers
VLT offers a wide range of professional headlight beam testers. From simple manually operated models up to fullly automated robot type machines for use in integrated test lanes.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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Ion Chromatography
940 Professional IC Vario
High-end ion chromatography system for research applications and method development
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Shear Beam Load Cell
SB-1.0
The Shear Beam Load Cell SB-1.0 is a single point weighing device, suitable for use in multiple applications.
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Spectro UV-Vis Double Beam PC Scanning Spectrophotometer
UVD-2950
Spectro UV-Vis Double PC is a high performance UV-Vis double beam automatic scanning spectrophotometer. Spectro UV-Vis Double has a brand new optical system design, microcomputer controlled. It is capable of processing data, from analytical and spectrum testing. Precise with high accuracy of measurement and stability are also provided by the powerful built in software and large LCD screen, which can display the screen menu and other functions. It can also be linked to a computer and a printer to show Photometric and Spectral data in the PC monitor.
