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- CAMI Research Inc. (CableEye®)
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
CAMI Research Inc. (CableEye®)
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large library to match your connector. Then touch the tester probe to the connector pins one-by-one to automatically detect and assign a test point to each pin. A synthetic voice reads probed pins as you touch them so you don’t need to take your eyes off the connector you’re probing. Finally, enter pin labels of your choice if you wish to override the standard designations.
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CAM/GATE Test Kits
Series 45
The CG Series 45 CAM/GATE linear over clamp kits utilize the same patented “Z” axis motion as our CAM/TRAC® Series products offering precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The latch assembly engages and disengages when actuating the clamping assembly. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components
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ITA, ICon XL, 2 Module, Extra-Large Backshell, EMI
410123232
The iCon XL offers an extra-large u-shaped cable clamp that can hold cable bundles with an oblong bushing effective diameter of 1.95" and offers a cable bend radius of 1". A slide-off backshell allows easy access to wiring for maintenance and probing. The iCon XL also offers EMI shielding.
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Microwave Testing
500B
The Model 500B Picoprobe sets new® standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 500B Picoprobe achieves an insertion loss of less than 4.0 db and a return loss of greater than 15 db over its frequency range (see accompanying data).
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DH Series QuickLink Adapter Kit with 3 x QL-SI Tips
DH-QL-3SI
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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DDR4 Protocol Debug And Analysis Solution
U4972A
The U4972A DDR4 DRAM bundle provides software applications, probing, and hardware options for DDR4 DRAM debug, compliance validation, and analysis. The U4972A bundle includes systemization of hardware (modules installed into chassis) and software loaded onto the M9537A controller.
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Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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Power Measurement
An innovative product that provides better solution for power probing. Common DC power statistics including voltage, ampere and even the watt can be read instantly via NuDC-4U. Moreover, up to 4 sets of individual powers can be monitored simultaneously and the LCD screen can also display the maximum and minimum value of the current power during the test.
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Vibration Isolation Tables
Probing Solutions offers Vibration isolation tables made by Kinetics and TMC. To order a table, please call PSI at (775) 246-0999, or email sales@probingsolutions.com for a quote.
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ITA, I1 XL, 1 Module, Extra-Large Cable Exit
410128106
The i1 XL offers an extra-large cable exit that can hold cable bundles with a bushing effective diameter of 1.26" . A slide-off backshell allows easy access to wiring for maintenance and probing. Most commonly used in high-power applications with VPC's high power modules and patchcords. Includes protective cover (not pictured).
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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PORTABLE COORDINATE MEASURING MACHINE
CMM
The HandyPROBE arm-free probing system generates high-accuracy measurements (accuracy of up to 22 µm), and outperforms traditional portable CMMs on the shop floor. The HandyPROBE portable CMM is currently used on the production lines of major players from the automotive, aerospace and manufacturing industries.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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ITA, I2 Micro ICon, 168 Position
410130101
The i2 Micro iCon ITA is capable of holding up to 168 QuadraPaddle contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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CAM/TRAC Test Kits
The Camtrac (registered trademark) series test fixtures provides ‘Z’ axis motion that reduces probe side loading typically seen with Clamshell type test fixtures. This not only extend the life of the probes, but additionally, provide better probing accuracy, especially on fine pitch test centers. Camtrac fixtures are available with the most widely used interfaces in the test industry.
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CC-TLP Probe
CC-TLP-50-A1
High Power Pulse Instruments GmbH
*Capacitively coupled TLP probearm (CC-TLP) compatible with standard probing stations*18 GHz SMA connector*Tilt angle adjustment*Calibration gauge for needle height
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Magnetic Probing Systems
MPS-C-300 and MPS-C-350
MicroXact’s truly unique patent-pending design enables wafer-level testing of spintronic devices, nanoscale electronics and many other materials and devices where magnetic fields are required for accurate test and measurement.
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Microwave Probes
S-Probe
S-Probe series of single-ended probes can perform up to 20 GHz are designed for RF, power integrity, and signal integrity testing. Its strong beryllium copper (BeCu) tips is perfect for direct probing of uneven surfaces, such as solder pads and circuit components. This is a big improvement over the fragile microprobes.
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PCIe Carrier For PMC And PrPMC
PCI104
The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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Probe Card
VersaTile™
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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High Volume / Double-Side Applications
APS 80D
Simultaneous, double-sided probing of up to 8" wafersPowerful, user-friendly control and monitoring softwarePlanarization of needle sets and constant preset needle loadPattern recognition systemRobot handling systemConfigurable to voltages in excess of 5 kV for specialized applications
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Software Module for Analyzing Measured Data to any CAD Model
Verisurf Analysis
Simplifies part inspection through the comparison of measured points, clouds, and meshes, to all CAD file formats. Check part characteristics such as position and profile quickly and easily using a variety of alignment, analysis, and reporting techniques.Analyze to CAD with imported data sets or directly from measured points, clouds, or meshes from 3D measuring devices including portable probing and scanning systems and both manual and CNC CMMs to analyze part tolerance compliance.
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Micropositioner
XYZ 500 MIMT
Quarter Research and Development
Submicron manipulator and translation stage. The XYZ-500-MIMT Micropositioner is intended for precise probing and instrumentation for industrial, medical, biological, semiconductor, and general scientific applications. It provides 3-axis motion with .500" movement on each axis. Motion is controlled by three precision stepping motors attached to precision gear heads 64:1 (standard), that drive a 100 threads per inch screw (standard).
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PRO Test Lead Kit
142
#142 Pro Test Lead Kit includes our premium set of interchangeable specialty test probes designed for automotive use. This lead set features an extended length of 64 inches. The flexible back probing pins are great for sliding into automotive connectors like those on fuel injectors and MAP sensors. In addition, the large Crocodile Clips are good for clipping to grounds and battery terminals. Includes roll up storage pouch to keep your leads organized. These are compatible with most DMM’s and scopes.
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DH Series Tip - CrossSync PHY PCIe5 CEM x16
DH-CSPHY-PCIE5-CEMX16
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Wafer Testing
Trio Vertical
SV TCL's TrioTM is a reliable solution for advanced wafer testing challenges, specifically full array and parallel probing. We offer a complete line of vertical probe card products, each designed for your unique application.
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CMM Contact Measurement (Probing)
A method of collecting single points relative to each other in small or large volumes. This information can then be used for evaluation, inspection, layout or basic geometric reverse engineering. For capturing localized or small volume information, digitizing or articulating arms are ideal. For larger volumetric projects, optical solutions like laser trackers and photogrammetry CMMs perform best.
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DYNAMIC TRACKING
VXTRACK
The C-Track dual-camera sensor is a complete portable 3D measurement solution that offers probing inspection and dynamic measurement capabilities. It is fitted with high-quality optics and special lighting, enabling it to measure all reflectors within its operating space. The probing stylus is very useful for aligning parts with respect to a referential (calculated using a group of reflectors), which allows movement or deformation monitoring directly on the part's referential.
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Custom PCB Test Fixtures
Emergent Electro-Mechanical designs and manufactures customized test fixtures and burn-in racks. Each of our custom designs is unique to our customer's particular project requirements. Emergent fixtures feature innovative design components including a linear collapsing system, interchangeable and reusable plate design, and top and bottom probing.
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Metra Scan 3D
The most accurate scanning and probing solutions, whether in lab or on the shop floor.Highly accurate measurementDynamic referencingComplete metrology solution
