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ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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Combination Tester
Focus-4000
Programmable power supply（User can select big volume or high accuracy model）Fixed power supply (5V/12V/24V acceptable)High accuracy current measurement(MAX 2A) - FX710Voltage measurement MAX 16points(within +/-60V) - FX710Short relays 16pcs (MAX current 1A) - FX62024CH digital input output pins(8pcs per unit, IN/OUT setting) - FX700/FX71016 open corrector output for controlling external relays16 port (simultaneously 2 ports ) Oscilloscope channel for observing wave formCommunication function RS232C/GPIB（Standard）、CAN/LIN communication, Programmer(Options)Focus-2000Plus unique in-circuit Test（ICT）function
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ICT Probes
Merica Series-MPA50
Minimum Center: 1.27(50mil)Current Rating: 3amps, continuousCurrent Resistance: 60milliohmsFull Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 122gf(4oz)
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Medalist i1000D
U9401B
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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QAM And PCM Analyzers
GAOTek provides a wide range of high performance and inexpensive QAM/PCM analyzers. Quadrature amplitude modulation (QAM) and pulse code modulation (PCM) analyzers are convenient instruments with top to bottom estimations and adaptable setups. Additionally, these devices have integrated functions of analog signal generators/receivers, BERT, signaling generators/receivers, selective level meters, ring generators/ identifications, dialers, DC loop circuits (ICT, OGT), balanced bridges and reflecting bridges into solitary instruments. These analyzers are ideal for installing and maintaining digital and analog networks.
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Spring Contact Probe
ICT
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
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Boundary Scan Program Development Service
No need for test fixtures. Integrates product development, production test, and device programming in one system. Test and Programming data can be reused in Production. Fast test procedure development. Reduced inventory management. Eliminates or reduces ICT usage time. Pre-production testing can begin as soon as prototype is released.
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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XJLink2-3070
The XJLink2-3070, approved by Keysight Technologies, provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from Keysight (Agilent) i3070 ICT machines.
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Boundary Scan Test (BST)
In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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In-line High-Density ICT System Series 7i
E9988GL
The E9988GL Keysight i3070 Series 7i Inline High-Density In-Circuit Test (ICT) system brings industry-leading ICT technologies into your automated manufacturing line, saving resources and optimizing your automated test strategy.
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In-circuit Test
i3070
The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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Test Fixture Adapters for In-Circuit Test Fixtures
Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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In-Line RF Test Station
AP770
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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In-Circuit Test
TR5001T
The TR5001T Tiny 2 ICT is a new full feature In-Circuit board tester with a laptop sized footprint that provides a very cost effective alternative to large In-Circuit testers.
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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In-Circuit Test Fixtures
In-circuit testing provides electronic manufacturers a reliable, high fault coverage verification method for the assembly process. Circuit Check ICT fixtures are robust, reliable and designed for easy customization to cover a large range of PCB sizes without impacting turnaround time. We stock a large variety of fixture sizes and actuation methods to meet your test demands. If a stocked sized ICT fixture is not adequate our engineering staff will design a custom solution.
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ICT Probes
ICT Probes - Test Center: 50 - 100 milsCurrent Rating: 3 - 5 ampsContact Resistance: 30 - 50 milliohmsSpring Force: 113 - 312 gf (4-11 oz)
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Utility Card: Flash Programming Applications
This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Flipper
H71007100
Easy operator access for loading and unloading the DUT, thanks to the flip operation performed by the Flipper module. Combined test (Hipot, ICT & Funcional) Rack&stack module for 19 inch frame 6 U height (266,7 mm 10.5”) Pushing force up to 900N (more than 400 needles @2N) Power supply 230V 50-60 Hz. Compressed air not required High dynamics and precission CNC servocontroller PCB areas up to 232x358mm. Bigger areas available under request. Interchangeable cassette for upper bed of nails or actuators
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PXI Based Multifunction Measurement and ICT Instrument
PXI-501
The PXI-501 is a multifunction measurement instrument for functional and in-circuit measurements.It combines two parametric measurement units with a digital voltmeter, a high voltage current source and a discharge unit. This powerful combination makes it the ideal instrument for classical analog in-circuit test and manufacturing defect analysis with additional functional test capabilities.With it’s fast sampling rate of up to 4MSps it speeds up measurements and is capable of measuring and generating AC signals up to 100kHz.To enhance the PXI-501 capabilities it can be combined with an ABex TM-501 or an ABex TM-404. The ABex TM-501 enhances the in and output range of the PXI-501. Furthermore, it provides a shunt current measurement upgrade. In combination with the ABex TM-404 it’s a complete in-circuit test solution with 86 channels in one ABex slot. For sure it can be upgraded to 2838 test points in one rack by simply adding additional matrix modules.With the above-mentioned terminal modules, the PXI-501 is able to act as a ABex system controller, so that no additional controller is required in the cassis.
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ABex Matrix Module with 86x4 or 43x8 Cross Points
ABex TM-404 Matrix
The ABex TM-404 is a 86×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex TM-404 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus. The back connector allows to connect the TM-404 to the front of a Konrad PXI-501 ICT card to build a very compact ICT instrument. In addition, this combination can be used as an ABex system controller
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ICT / FCT Probes
*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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XJLink2-3030
The XJLink2-3030 provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from SPEA 3030 ICT machines.
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ICT Probes
Merica Serirs- MP175
Minimum Center: 1.91mm (75mil)Current Rating: 3amps, continuousContact Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.40mmRated Stroke:4.30mmSpring Force: 203gf (7.2oz)/227gf(8oz)
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
