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Electron Spectroscopy for Chemical Analysis
determine the atomic composition of a surface.
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Energy Dispersive X-Ray Spectroscopy (EDS)
Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Auger Electron Spectroscopy (AES)
Rocky Mountain Laboratories, Inc.
Auger Analysis, Auger Electron Spectroscopy (AES or Auger) is a chemical surface analysis method. AES measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Analytical Services
IGC: Inverse Gas Chromatography; Understand surface energies, polarities, acid/base properties and nanomorphology on powders and fibers. ToF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry. Localize your molecules at the first nanos! 2D imaging with resolution up to 200 nm. Highest sensitivity up to 10 ppm. CM: Quarz Crystal Microbalance In-situ observation of thickness and stiffness of any films in liquid environmentSEM: Scanning Electron Microscopy Images say more than words, especially with an artistic eye XPS/ESCA: X-ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical Analysis.
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XPS/ESCA Service
X-ray Photoelectron Spectroscopy (XPS Analysis), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is used to determine quantitative atomic composition and chemistry. It is a surface analysis technique with a sampling volume that extends from the surface to a depth of approximately 50-70 Angstroms. Alternatively, XPS analysis can be utilized for X-ray Photoelectron Spectroscopy (XPS) or Electron Spectroscopy for Chemical Analysis (ESCA) from Evans Analytical Group (EAG).sputter depth profiling to characterize thin films by quantifying matrix-level elements as a function of depth.
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Electron Multipliers
Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain (multiplication factor) yet low dark current, allowingoperation in photon counting mode to detect and measure extremely small incoming particles and their energy. This means our Hamamatsu electron multipliers are ideal for electron spectroscopy and vacuum UV spectroscopy such as ESCA (electron spectroscopy for chemical analysis) and Auger electron spectroscopy as well as mass spectroscopy and field-ion microscopy.
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Imaging X-Ray Photoelectron Spectrometer
Kratos AXIS Nova
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.
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Chemical Analysis
The chemists at IMR have numerous analytical tools at their disposal, all geared toward providing accurate, NIST traceable analyses of metals and process solutions. The staff is experienced, professional, and knowledgeable in the latest analytical techniques.
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Electron Sources
SPECS Surface Nano Analysis GmbH
To our customers in research and industry we offer a variety of sources for deposition, excitation and charge neutralization as well as analyzers and monochromators. Most of our sources originate from product lines which we have taken over from Leybold AG, Cologne, and from VSI GmbH. The X-ray monochromator Focus 500 and the UV monochromator TMM 302 are original developments by SPECS.Compliance with industry standards, a good price-performance ratio, stability, and longevity are the guidelines for our product development. We focus on standardized easy handling, user-friendliness, standardized software interfaces and safety.
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Spectroscopy
NIRS XDS Process Analyzer
NIRS XDS Process Analyzer systems can measure a variety of sample types, such as granules, powders, liquids, slurries, or opalescent substances, among others. These analyzers provide fast, nondestructive analysis of pharmaceutical, chemical, and petrochemical products. If required, up to 9 inline measuring channels can be multiplexed with this system.
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Electron Spectrometers
SPECS Surface Nano Analysis GmbH
Nanotechnology is focused on the engineering and the physical properties of small structures. Therefore techniques that have sensitivities at a scale of 0.1 nm to 100 nm are required to study these structures. Different methods of electron spectroscopy (XPS, UPS and AES) have a sensitivity in this range and are therefore key techniques in nanoscience.Thanks to our high level of expertise in electron optics and electronics we can offer electron spectrometers with the highest resolution and transmission possible.
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Chemical Testing
Our modern and comprehensive Chemical Laboratory has been certified and registered in accordance with the Environmental Laboratory Accreditation Program (ELAP) and by the State of California Department of Health Services.
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Spectroscopy
Vis-NIR Spectroscopy Lab Analyzers
Metrohm NIRS lab analyzers enable you to perform routine analysis quickly and with confidence – without requiring sample preparation or additional reagents and yielding results in less than a minute. Combining visible (Vis) and near-infrared (NIR) spectroscopy, these analyzers are capable of performing qualitative analysis of various materials and quantitative analysis of a number of physical and chemical parameters in one run.
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Chemical Testing
Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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Chemical Absorbance Systems
UV-VIS & NIR systems for chemical absorbance measurements 190-2300nmSpectrochemistry Systems include a miniature spectrometer, light source, and sampling accessory such as cuvette holders, dip probes, & flow cellsSpectraWiz Software has built in features for ChemWiz Concentration Analyzer with multivariate chemometric optionsEpisodic capture for kinetics, time series analysis, & batch monitoringEasily convert to fluorescence or reflectance for multi applicationsGreat for Teaching Labs, Research, Process Control & much more!Also see details about our Fluorescence and Raman Systems
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Chemical Metering Pump
QED chemical metering pumps are suitable for dispensing chemicals for a variety of anti-scaling and anti-foaming applications. These pumps provide precise and adjustable delivery of anti-scale/anti-foam agents. Graco chemical metering/injection pumps deliver flow rates from 17 to 150 gallons per day and operate in -40° F to 175°F (-40°C to 79°C) temperatures.
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Electron Probe Microanalyzer
JXA-8530FPlus
JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Scanning Electron Microscopy
SEM
Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Digital Spectroscopy
CAEN SyS is the new Systems & Spectroscopy Division of CAEN Spa. Such Division relies upon an extremely strong foundational knowledge of nuclear measurement instrumentation in developing Radiation Measurements Systems and Spectroscopy Solutions. These systems and solutions are perfectly suited to operations involving Nuclear Fuel Facilities, Nuclear Power Plants, Measurements Laboratories, and Security Applications.
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Chemical Analysis + Surface Analysis
Rocky Mountain Laboratories, Inc.
An independent surface chemistry and microanalysis laboratory to serve the needs of industrial, academic, and governmental clients. Our objective – to provide real-world solutions for industries with materials and process development needs – is as fundamental to our organization today as when we began. Over the years we have strived to adapt our services to the specific needs of these clients.
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Materials And Chemical Analysis
Anderson Materials Evaluation, Inc.
Materials characterization, failure analysis, quality control, and materials and process development services are offered. Our analytical techniques allow us to assess elemental and chemical material composition, thermal properties, coating thickness, electrochemical properties, surface chemistry, surface wetting, corrosion rates and pitting potentials, contamination and degradation problems, metallography, fractography, phase transitions, static coefficient of friction, adhesive bonding strength and causes of adhesive bonding failures, surface tension and surface energy, tensile and compressive strength, bend deflection, lapshear strength, elasticity properties, UV and visible light absorption and reflection, density and porosity, and many other material properties integral to improving your products.
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Chemical Weapons Identification Systems
Portable Isotopic Neutron Spectroscopy (PINS) Systems have been deployed world-wide; increasingly, being deployed as part of national counter-terrorist efforts. PINS provides a non-contact and non-destructive means of identifying the CHEMICAL contents of "suspect" packages.
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Picosecond-Diode Lasers for Spectroscopy
Designed and manufactured by Becker & Hickl – bh delivers prominent picosecond diode lasers with wavelengths from the NUV to the NIR. All bh pulsed diode lasers work with simple +12V power supply or pull their power from the USB port of a PC or Notebook Computer. Other features are high repetition rate, short pulse width, unprecedented timing and power stability, and extremely low electrical noise level.
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Custom Spectroscopy Solutions
Scientific discovery doesn’t always follow traditional pathways. The Optical Spectroscopy Division custom configures spectrometers, monochromators, microspectroscopy, CCD’s and other instruments for fluorescence spectroscopy and other R&D and QC applications. We design systems that meet your individualized research or application needs. We create the tools required to make investigations where standardized tools do not meet your needs or where no tools currently exist.
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Chemical Testing
Chemical testing and analysis spans a wide variety of services, from ion chromatography to high voltage arc tracking. With the assistance of international standards for guidance, chemical testing can ensure regulatory compliance while also providing information about the chemical composition of product material.
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Transmission Electron Microscope
TEM
Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Molecular Spectroscopy
Molecular Spectroscopy requires a range of technologies, including pick-and-place automation for moving sample tubes, sample injection automation to reduce sample contamination and consumption of rinse-solutions, and basic autosamplers for delivering samples to the analyzer. A variety of pumping technologies are also used to manage the delivery of samples and rinse solutions as needed.
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Chemical Oxygen Demand (COD) Analyzer
PeCOD®
MANTECH’s revolutionary PeCOD® Analyzer technology provides accurate chemical oxygen demand (COD) results in 15 minutes — without the use of harmful chemicals including dichromate and mercury. Highly adaptable for wastewater and drinking water applications, the PeCOD® Analyzer’s patented nanotechnology-based approach to COD analysis will save you time and money while protecting the environment and the health and safety of your workers.
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Gamma Spectroscopy
Gamma spectroscopy is the science (or art) of identification and/or quantification of radionuclides by analysis of the gamma-ray energy spectrum produced in a gamma-ray spectrometer.
