Bruker Nano Analytics

Bruker presents a new variety of choice in instrumentation by expanding its portfolio of high-performance analytical tools for materials characterization in electron microscopes. With the introduction of the new XSense WD spectrometer and the new XTrace X-ray source for Micro-XRF on SEM, Bruker is the first company to offer all 5 analytical techniques, EDS, WDS, EBSD, Micro-XRF and Micro-CT, for the SEM